Measuring small differential-mode voltages with high common-mode voltages and fast transients – Application to gate drivers for wide band-gap switches

Autor: Hadiseh Geramirad, Christian Vollaire, Florent Morel, Arnaud Breard, Bruno Lefebvre

Publikováno v: International Symposium on Electromagnetic Compatibility-EMC EUROPE
International Symposium on Electromagnetic Compatibility-EMC EUROPE, Sep 2020, Rome, Italy. pp.1-5, ⟨10.1109/EMCEUROPE48519.2020.9245720⟩

International audience; In power electronics, gate-voltage measurement is used to optimize the design of the gate driver. Therefore a proper measurement technique is vital to ensure the proper operation of the electronic device. Measuring a small sig

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c30ad6fd3619a2a5768bacb9adc89cd3
https://doi.org/10.1109/emceurope48519.2020.9245720