Výsledky vyhledávání - "Ismo T. S. Rauha"

Fast Wafer-Level Characterization of Silicon Photodetectors by Photoluminescence Imaging

Autor: Hussein M. Ayedh, Christopher W. Forbom, Juha Heinonen, Ismo T. S. Rauha, Marko Yli-Koski, Ville Vahanissi, Hele Savin

Publikováno v: IEEE Transactions on Electron Devices. 69:2449-2456

avaa käsikirjoitus, kun julkaistu. Photoluminescence imaging (PLI) technique is conventionally used in Si photovoltaics (PV) for device characterization and inline quality control, providing substantial assistance for a wafer-level process monitorin

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::553f89b8975dd74828f8a525be2626ca
https://doi.org/10.1109/ted.2022.3159497

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(poster) Photoelectron Emission Spectroscopy Analysis on the Degradation of AlOx Surface Passivation under Damp Heat and Light Soaking

Autor: Ismo T. S. Rauha, Hendrik Kaser, George Koutsourakis, Sauli Virtanen, Sebastian Wood, Emma Salmi, Michael Kolbe, Fernando Castro, Hele Savin

Publikováno v: Aalto University

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::891ec05626971021611522e21e2d2c6c
https://research.aalto.fi/en/publications/99524bbb-c7ac-41cd-9a40-691ae325b843

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(poster) On the Surface Passivation Stability of Spatial Atomic Layer Deposited Aluminum Oxide Films for Photovoltaics

Autor: Ismo T. S. Rauha, Sauli Virtanen, Marko Yli-Koski, Iris Mack, Ville Vähänissi, Emma Salmi, Hele Savin

Publikováno v: Aalto University

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1b6d1bf2183d16da7b372e217f8ef8dc
https://research.aalto.fi/en/publications/2c34b283-87a2-4d20-8232-15a63014d0b9

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(poster) Stability of the Surface Passivation Properties of Atomic Layer Deposited Aluminum Oxide in Damp Heat Conditions

Autor: Ismo T. S. Rauha, Ville Vähänissi, Hele Savin

Publikováno v: Aalto University

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::11e0d4296881e04884ba6916129ce94d
https://research.aalto.fi/en/publications/6d0c8d7a-7b8a-416f-af64-b276bffafb15

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(oral talk) Can hydrogenation mitigate Cu-induced bulk degradation in silicon?

Autor: Ismo T. S. Rauha, Brendan Wright, Soeriyadi, Anastasia H., Marko Yli-Koski, Moonyong Kim, Ville Vähänissi, Hallam, Brett J., Hele Savin

Publikováno v: Aalto University

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6e18fc26012fca150e46261678557e0c
https://research.aalto.fi/en/publications/733399df-1960-4a64-81fa-cfcee14fbe5a

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(oral talk) Efficient surface passivation of black silicon using spatial atomic layer deposition

Autor: Ismo T. S. Rauha, Päivikki Repo, Ville Vähänissi, Pasanen, Toni P., Ville Malinen, Hele Savin

Publikováno v: Aalto University

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::19d73dbb384a9107e0a3be92f770d076
https://research.aalto.fi/en/publications/550609a3-3f89-4b5a-9c95-c30e9af78b08

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