Zobrazeno 1 - 10
of 836
pro vyhledávání: '"Irrera, F"'
Autor:
Mazzetta, I., Viti, L., Rigoni, F., Quaranta, S., Gasparotto, A., Barucca, G., Palma, F., Riello, P., Cattaruzza, E., Asgari, M., Vitiello, M., Irrera, F.
Publikováno v:
In Materials & Design May 2022 217
Publikováno v:
In Solid State Electronics December 2021 186
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1446-1449
Autor:
Lorenzi, P., Rao, R., Romano, G., Kita, A., Serpa, M., Filesi, F., Parisi, R., Suppa, A., Bologna, M., Berardelli, A., Irrera, F.
Publikováno v:
In Procedia Engineering 2015 120:324-327
Autor:
Irrera F; Department of Information Engineering, Electronics and Telecommunications, Sapienza University of Rome, 00185 Rome, Italy., Gumiero A; STMicroelectronics Agrate, 20864 Agrate Brianza, Italy., Zampogna A; Department of Human Neurosciences, Sapienza University of Rome, 00185 Rome, Italy., Boscari F; Department of Medicine, University of Padua, 35122 Padua, Italy., Avogaro A; Department of Medicine, University of Padua, 35122 Padua, Italy., Gazzanti Pugliese di Cotrone MA; Department of Information Engineering, Electronics and Telecommunications, Sapienza University of Rome, 00185 Rome, Italy., Patera M; Department of Human Neurosciences, Sapienza University of Rome, 00185 Rome, Italy., Della Torre L; STMicroelectronics Agrate, 20864 Agrate Brianza, Italy., Picozzi N; STMicroelectronics Agrate, 20864 Agrate Brianza, Italy., Suppa A; Department of Human Neurosciences, Sapienza University of Rome, 00185 Rome, Italy.; IRCCS Neuromed, 86077 Pozzilli, Italy.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2024 Feb 28; Vol. 24 (5). Date of Electronic Publication: 2024 Feb 28.
Publikováno v:
In Microelectronics Reliability September-November 2013 53(9-11):1203-1207
Publikováno v:
2022 IEEE 21st Mediterranean Electrotechnical Conference (MELECON).
Akademický článek
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Publikováno v:
In Solid State Electronics August 2008 52(8):1188-1192
Autor:
Puzzilli, G., Irrera, F.
Publikováno v:
In Microelectronic Engineering 2007 84(9):2394-2397