Zobrazeno 1 - 1
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pro vyhledávání: '"Irfan Uilah"'
Publikováno v:
Applied Thermal Engineering. 138:183-196
The discharging in the dielectric fitting can generate thermal shock and thermal stress, which will break the insulation and containment of the dielectric fitting. The discharging process in the dielectric fitting causes the multiple physical field c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf83c22df5f51e28ffaa3aa93750febb
https://doi.org/10.1016/j.applthermaleng.2018.04.057
https://doi.org/10.1016/j.applthermaleng.2018.04.057
