Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Iretomiwa Esho"'
Autor:
Bekari Gabritchidze, Kieran Cleary, Jacob Kooi, Iretomiwa Esho, Anthony C. Readhead, Austin J. Minnich
Publikováno v:
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::130cf69f6d6d41dc876f30c88d37d3d3
https://doi.org/10.1109/ims37962.2022.9865505
https://doi.org/10.1109/ims37962.2022.9865505
Autor:
Bekari Gabritchidze, Iretomiwa Esho, Kieran A. Cleary, Anthony C. Readhead, Austin J. Minnich
Publikováno v:
2022 Compound Semiconductor Week (CSW).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e27c66af371fe261e1c095b99349bfb0
https://doi.org/10.1109/csw55288.2022.9930365
https://doi.org/10.1109/csw55288.2022.9930365
Cryogenic low noise amplifiers based on high electron mobility transistors (HEMTs) are widely used in applications such as radio astronomy, deep space communications, and quantum computing, and the physical mechanisms governing the microwave noise fi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76c1c6c18b7ed692b11b3c0a55cf178e
http://arxiv.org/abs/2105.11571
http://arxiv.org/abs/2105.11571
Publikováno v:
Journal of Applied Physics. 131:085111
High electron mobility transistors are widely used as microwave amplifiers owing to their low microwave noise figure. Electronic noise in these devices is typically modeled by noise sources at the gate and drain. While consensus exists regarding the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ab21eca8fe2dd23645f368b261fdf775
https://doi.org/10.1063/5.0069352
https://doi.org/10.1063/5.0069352
Publikováno v:
Applied Thermal Engineering. 145:287-294
Li-ion cells are widely used for electrochemical energy conversion and storage, but suffer from safety problems due to overheating. At elevated temperatures, the cell enters a state of thermal runaway involving multiple heat-generating decomposition
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3ffbc336d6d72e57fa3ad183ecac7ca
https://doi.org/10.1016/j.applthermaleng.2018.09.016
https://doi.org/10.1016/j.applthermaleng.2018.09.016