Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Ireneusz Mrozek"'
Publikováno v:
Applied Sciences, Vol 14, Iss 6, p 2501 (2024)
This paper addresses the problem of describing the complex linked coupling faults of memory devices and formulating the necessary and sufficient conditions for their detection. The main contribution of the proposed approach is based on using a new fo
Externí odkaz:
https://doaj.org/article/674cd654c178432d9b40f9ecf4a3979f
Publikováno v:
Entropy, Vol 23, Iss 7, p 894 (2021)
An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and netw
Externí odkaz:
https://doaj.org/article/82e9ab27a5134f2fb6c1ecbdcd17c1a3
Publikováno v:
Informatika, Vol 17, Iss 2, Pp 54-70 (2020)
The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::71b830b51bfe2cd51d0682423ad6dce8
https://inf.grid.by/jour/article/view/1050
https://inf.grid.by/jour/article/view/1050
Autor:
Ireneusz Mrozek
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering
Publikováno v:
Fundamenta Informaticae. 144:23-43
The chapter presents a new approach to multiple testing. In the previous sections, controlled random testing as constructing random test patterns, where the next test pattern is generated while taking into account the previously formed patterns, was
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2dcf5411a6f3df59cbad9aabdb608e1
https://doi.org/10.3233/fi-2016-1322
https://doi.org/10.3233/fi-2016-1322
Pseudo-Exhaustive Random Access Memory Testing Based on March Tests with Random Background Variation
Publikováno v:
EWDTS
Studying the efficiency of memory system tests, we have to take into consideration the complexity of generating all 2k combinations for k memory cells, which is an essential and in many cases sufficient condition, which allows detecting different com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9fc63906d68adbc42316cccc6cd829a
https://doi.org/10.1109/ewdts.2018.8524824
https://doi.org/10.1109/ewdts.2018.8524824
Autor:
Ireneusz Mrozek
Publikováno v:
Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 9783319912035
The chapter focuses on pattern sensitive faults. First, neighborhood pattern sensitive faults and classical algorithms for their detection are analyzed. Then, the unrestricted pattern sensitive faults and their detection capabilities by march tests a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0719402589d42ac324b859b16849055
https://doi.org/10.1007/978-3-319-91204-2_3
https://doi.org/10.1007/978-3-319-91204-2_3
Autor:
Ireneusz Mrozek
Publikováno v:
Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 9783319912035
The chapter covers controlled random tests (CRTs) that are extensively used for diagnosing complex digital circuits and systems. First, the basic definition and properties of CRTs are given. Then, the classical approach proposed by Malaiya is describ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90de459d884e4be98e8c0591d3386d48
https://doi.org/10.1007/978-3-319-91204-2_4
https://doi.org/10.1007/978-3-319-91204-2_4
Autor:
Ireneusz Mrozek
Publikováno v:
Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 9783319912035
The chapter examines the technique of multi-run tests based on address sequence reordering. First, the properties of different address sequences as well as methods of their generation are analyzed and investigated. Then, the effective algorithm for g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::717b7095707e6bcf89b38eedbb950a89
https://doi.org/10.1007/978-3-319-91204-2_6
https://doi.org/10.1007/978-3-319-91204-2_6