Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Iraj Moghaddasi"'
Autor:
Iraj Moghaddasi, Byeong-Gyu Nam
Publikováno v:
Machine Learning and Knowledge Extraction, Vol 6, Iss 3, Pp 1484-1493 (2024)
In recent years, deep neural networks (DNNs) have addressed new applications with intelligent autonomy, often achieving higher accuracy than human experts. This capability comes at the expense of the ever-increasing complexity of emerging DNNs, causi
Externí odkaz:
https://doaj.org/article/2ee3adbb86c845e6b391cab1e91cd59b
Publikováno v:
IEEE Access, Vol 12, Pp 96552-96564 (2024)
Deep neural network (DNN) is becoming pervasive in today’s applications with intelligent autonomy. Nonetheless, the ever-increasing complexity of modern DNN models caused several challenges on edge devices, struggling to support the intensive compu
Externí odkaz:
https://doaj.org/article/8887401f535643c9815ec104d79705e4
Publikováno v:
IEEE Access, Vol 11, Pp 89803-89834 (2023)
In the modern era, artificial intelligence (AI) and deep learning (DL) seamlessly integrate into various spheres of our daily lives. These cutting-edge disciplines have given rise to numerous safety-critical applications such as autonomous driving wi
Externí odkaz:
https://doaj.org/article/63b423e2810342b796a75b8b67f31afc
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28:433-442
CMOS miniaturization and timing faults due to factors, such as aging, emphasize that embedded processor reliability is a major concern. Among the various aging mechanisms, negative bias temperature instability (NBTI) is encountered as the dominant fa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f4cac41b91b34cbf34767fcd45f1b9f
https://doi.org/10.1109/tvlsi.2019.2947757
https://doi.org/10.1109/tvlsi.2019.2947757
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:1427-1437
Lifetime reliability management of miniaturized CMOS devices continuously gets more importance with the shrinking of technology size. Neither of existing design-time solutions (like guard-banding) and runtime methods (like reactive monitoring) does e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72ec2d85c0e2fa292120610dfccadd6a
https://doi.org/10.1109/tcad.2018.2846629
https://doi.org/10.1109/tcad.2018.2846629