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pro vyhledávání: '"Iori Nakata"'
Publikováno v:
IEEE Transactions on Electron Devices. 68:2906-2911
This article reports the influence of both contact condition and island edge on the electrical characteristics of the pseudo-metal-oxide-semiconductor-field-effect-transistor (pseudo-MOSFET) method. Our measurements reveal the sensitivity of the clas
Publikováno v:
IEEE Transactions on Electron Devices; Jun2021, Vol. 68 Issue 6, p2906-2911, 6p