Zobrazeno 1 - 10
of 110
pro vyhledávání: '"Integrated circuit yield"'
Autor:
Hochbaum, Dorit S.1, Liu, Sheng1
Publikováno v:
Operations Research. Nov/Dec2018, Vol. 66 Issue 6, p1571-1585. 15p. 8 Charts, 2 Graphs.
Publikováno v:
Journal of Microelectronic & Electronic Packaging. 2011 3rd Quarter, Vol. 8 Issue 3, p114-120. 7p.
Autor:
Tam, Wing Chiu1, Blanton, Shawn1
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Oct2014, Vol. 33 Issue 10, p1559-1572. 14p.
Autor:
Deutsch, Sergej1, Chakrabarty, Krishnendu1
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. May2014, Vol. 33 Issue 5, p774-785. 12p.
Autor:
Noia, Brandon1, Chakrabarty, Krishnendu1
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Mar2014, Vol. 33 Issue 3, p464-475. 12p.
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Mar2014, Vol. 33 Issue 3, p384-396. 13p.
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jan2014, Vol. 33 Issue 1, p127-138. 12p.
Autor:
Hsieh, Tong-Yu1 tyhsieh@mail.ee.nsysu.edu.tw, Wang, Chih-Hao1, Kuo, Chun-Wei1, Huang, Shu-Yu1, Chih, Tsung-Liang1
Publikováno v:
Journal of Electronic Testing. Dec2015, Vol. 31 Issue 5/6, p427-441. 15p.
Autor:
Kan, Tsang-Chi1 d9802101@mail.ntust.edu.tw, Ruan, Shanq-Jang1 sjruan@mail.ntust.edu.tw, Chang, Ting-Feng1 M9802125@mail.ntust.edu.tw, Yang, Shih-Hsien2 dean.yang@synopsys.com
Publikováno v:
Circuits, Systems & Signal Processing. Oct2015, Vol. 34 Issue 10, p3353-3372. 20p.
Autor:
Maadi, Mohammad1 maadi.mohammad@gmail.com, Bayram, Baris1 bbayram@metu.edu.tr
Publikováno v:
Microsystem Technologies. Apr2015, Vol. 21 Issue 4, p875-891. 17p.