Zobrazeno 1 - 10
of 863
pro vyhledávání: '"Integrated circuit reliability"'
Publikováno v:
Electronics Letters, Vol 60, Iss 23, Pp n/a-n/a (2024)
Abstract In this paper, a radiation hardened by design StrongARM comparator is proposed to mitigate the radiation effects. With 12 additional transistors compared to the conventional one, the proposed structure shows much higher immunity to single‐
Externí odkaz:
https://doaj.org/article/faee7d84b90640c39899e1ae1fd7e1ae
Autor:
Nima Jafarzadeh, Ahmad Jalili, Jafar A. Alzubi, Khosro Rezaee, Yang Liu, Mehdi Gheisari, Bahram Sadeghi Bigham, Amir Javadpour
Publikováno v:
IET Circuits, Devices and Systems, Vol 17, Iss 4, Pp 250-257 (2023)
Abstract Network‐on‐Chip (NoC) is a key component in chip multiprocessors (CMPs) as it supports communication between many cores. NoC is a network‐based communication subsystem on an integrated circuit, most typically between modules in a syste
Externí odkaz:
https://doaj.org/article/95fa5902782b4ed5a31f4e2bd55413ff
Autor:
Woychik, Charles G.1 CWOYCHIK@invensas.com, Lee, Sangil1, McGrath, Scott1, Arkalgud, Sitaram1
Publikováno v:
Journal of Microelectronic & Electronic Packaging. 2015 4th Quarter, Vol. 12 Issue 4, p219-225. 7p.
Publikováno v:
In Integration March 2023 89:197-206
Akademický článek
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Publikováno v:
IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Mar2018, Vol. 65 Issue 3, p960-969. 10p.
Autor:
Ibrahim, Walid1
Publikováno v:
IEEE Transactions on Computers. Jun2016, Vol. 65 Issue 6, p1748-1760. 13p.
Autor:
Broline, Josh1
Publikováno v:
Electronics Weekly. 3/14/2018, Issue 2723, p22-24. 3p. 2 Color Photographs, 1 Diagram, 1 Graph.
Publikováno v:
IET Computers & Digital Techniques, Vol 15, Iss 5, Pp 362-371 (2021)
Abstract Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period is vital particularly in reducing the dead time of critical applications that are running on FPGAs. Thus, this paper proposes a new technique that is
Externí odkaz:
https://doaj.org/article/eb036313ef2f4018b29394455450a928
Autor:
van Santen, Victor M.1, Martin-Martinez, Javier2, Amrouch, Hussam1, Nafria, Montserrat Maqueda2, Henkel, Jorg1
Publikováno v:
IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Jan2018, Vol. 65 Issue 1, p293-306. 14p.