Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Ingo Dirnstorfer"'
Autor:
Paul M. Jordan, Thomas Mikolajick, Talha Chohan, Daniel K. Simon, Johann W. Bartha, Martin Knaut, Ingo Dirnstorfer
Publikováno v:
IEEE Journal of Photovoltaics. 6:86-91
Al2O3-TiO2 nanolaminates are very attractive candidates for future conductive passivation layers because they are purely based on dielectric materials, which allow a simple integration in the state-of-the-art manufacturing process. In this study, Al2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9b77e953ea4a290673e4f4f5fc67bf5
https://doi.org/10.1109/jphotov.2015.2494695
https://doi.org/10.1109/jphotov.2015.2494695
Publikováno v:
ACS Applied Materials & Interfaces. 7:28215-28222
A controlled field-effect passivation by a well-defined density of fixed charges is crucial for modern solar cell surface passivation schemes. Al2O3 nanolayers grown by atomic layer deposition contain negative fixed charges. Electrical measurements o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98a4ae5cae8c8a87c32978293b46f26d
https://doi.org/10.1021/acsami.5b06606
https://doi.org/10.1021/acsami.5b06606
Autor:
Daniel K. Simon, Thomas Henke, Ingo Dirnstorfer, Paul M. Jordan, Thomas Mikolajick, Franz P. G. Fengler, Johann W. Bartha
Publikováno v:
physica status solidi (RRL) - Rapid Research Letters. 9:631-635
This value is achieved due to a very low interface trap density of below 1010 eV–1 cm–2 and a fixed charge density of (2–3) × 1012 cm–2. In contrast, plasma ALD-grown Al2O3 layers only reach carrier lifetimes of about 1 ms. This is mainly ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fbb042ade8c2f0eaf8e3f180d36ccb6
https://doi.org/10.1002/pssr.201510306
https://doi.org/10.1002/pssr.201510306
Autor:
Markus Eberstein, Thomas Mikolajick, Daniel K. Simon, Andreas Waltinger, Jan Gärtner, Niels Schilling, Paul Gierth, Stefan Koerner, Barbara Leszczynska, Jens Krause, Ines Dani, Lars Rebenklau, Ingo Dirnstorfer, Paul M. Jordan
Publikováno v:
Energy Procedia. 77:458-463
A silicon heterojunction solar cell based on amorphous and crystalline silicon is combined with the metal wrap through technology. In this novel solar cell concept one critical process is the via hole conditioning. Raman measurements reveal that the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::80b3a9892f76d259919950ed69ab83d9
Autor:
Ingo Dirnstorfer, Frank Benner, Daniel K. Simon, Paul M. Jordan, Claudia Richter, Thomas Mikolajick
Publikováno v:
Solar Energy Materials and Solar Cells. 131:72-76
Al 2 O 3 nanolayers, as currently used in the solar industry, provide excellent passivation over the entire injection level range for p -type Si. A high concentration of negative fixed charges guarantees excellent field effect passivation. However, o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37716225bd3783a4a265135cbfd06d27
https://doi.org/10.1016/j.solmat.2014.06.005
https://doi.org/10.1016/j.solmat.2014.06.005
Autor:
Thomas Mikolajick, Ingo Dirnstorfer
Publikováno v:
NanoScience and Technology ISBN: 9783319320212
Dielectric nanomaterials are emerging as key components in today’s highly efficient silicon solar cells. The most successful materials are SiO2, SiNx:H and Al2O3 due to their excellent material properties for surface passivation and light managemen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1f57336ae399e890cfb334d3b81398f
https://doi.org/10.1007/978-3-319-32023-6_2
https://doi.org/10.1007/978-3-319-32023-6_2
Publikováno v:
Microelectronic Engineering. 88:1148-1151
The resistive switching characteristics of Pt/TiO"2/Al devices were investigated. Amorphous and rutile TiO"2 samples were prepared and electrically characterized. The amorphous sample was sputtered at room temperature. The rutile phase of the TiO"2 w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4e72af3e5f99cc160d0323821b77abd
https://doi.org/10.1016/j.mee.2011.03.030
https://doi.org/10.1016/j.mee.2011.03.030
Publikováno v:
Journal of the Optical Society of America. A, Optics, image science, and vision. 32(4)
Mueller matrix spectroscopic ellipsometry becomes increasingly important for determining structural parameters of periodic line gratings. Because of the anisotropic character of gratings, the measured Mueller matrix elements are highly azimuthal angl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94e830debee5b9f85c46cbde6c7aa344
https://pubmed.ncbi.nlm.nih.gov/26366770
https://pubmed.ncbi.nlm.nih.gov/26366770
Autor:
Paul M. Jordan, Martin Knaut, Talha Chohan, Thomas Mikolajick, Daniel K. Simon, Ingo Dirnstorfer
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
Al2O3 based nanolaminates provide new functionalities for silicon surface passivation layers in future high-efficient cell concepts. This work presents two different applications: (I) Symmetrical passivation layers for application on p- and n-type Si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34392f8524870ae3ccc608be95a1cc99
https://doi.org/10.1109/pvsc.2015.7356401
https://doi.org/10.1109/pvsc.2015.7356401
Autor:
K. Meiner, U. Richter, Thomas Mikolajick, Anett Heinrich, J. Bischoff, H. Ketelsen, Ingo Dirnstorfer
Publikováno v:
SPIE Proceedings.
Critical dimension and line edge roughness on photomask arrays are determined with Mueller matrix spectroscopic ellipsometry. Arrays with large sinusoidal perturbations are measured for different azimuth angels and compared with simulations based on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::365761d97216756dce395e6d9b32363e
https://doi.org/10.1117/12.2065670
https://doi.org/10.1117/12.2065670