Výsledky vyhledávání - "Inelastic background analysis"

Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two- and three-parameter cross-sections

Autor: Charlotte Zborowski, Sven Tougaard

Publikováno v: Zborowski, C & Tougaard, S 2022, ' Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two-and three-parameter cross-sections ', Surface and Interface Analysis, vol. 54, no. 4, pp. 433-441 . https://doi.org/10.1002/sia.7020

Determination of the depth distribution of complex nanostructures by X-ray photoelectron spectroscopy (XPS) inelastic background analysis may be complicated if the sample materials have widely different inelastic scattering cross-sections. It was rec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3b1b138ad095c7aaa022bc8c19aedfe1
https://portal.findresearcher.sdu.dk/da/publications/66c9cac0-85bb-4c63-bc32-39f3bde7f0b5

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Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES

Autor: Sven Tougaard, C. Zborowski

Publikováno v: Surface and Interface Analysis
Surface and Interface Analysis, 2019, 51 (8), pp.857-873. ⟨10.1002/sia.6660⟩
Zborowski, C & Tougaard, S M 2019, ' Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES ', Surface and Interface Analysis, vol. 51, no. 8, pp. 857-873 . https://doi.org/10.1002/sia.6660

International audience; The approach of inelastic background analysis was previously demonstrated to be a useful tool for retrieving the depth distribution of buried layers with an accuracy, which is better than 5% even for some complex samples. This

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::860cf036e42a56938448d11906016765
https://doi.org/10.1002/sia.6660

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Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers:A comparison of synchrotron and lab-based (9.25 keV) measurements

Autor: Sven Tougaard, B.P. Reed, David J. H. Cant, Ben F. Spencer, Andrew G. Thomas, S.K. Eriksson, Alexander G. Shard, S. Maniyarasu, Wendy R. Flavell, Christopher A. Muryn, M. Maschek, T. Wiell, Ruben Ahumada-Lazo, Tien-Lin Lee

Publikováno v: Spencer, B F, Maniyarasu, S, Reed, B P, Cant, D J H, Ahumada-Lazo, R, Thomas, A G, Muryn, C A, Maschek, M, Eriksson, S K, Wiell, T, Lee, T L, Tougaard, S, Shard, A G & Flavell, W R 2021, ' Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers : A comparison of synchrotron and lab-based (9.25 keV) measurements ', Applied Surface Science, vol. 541, 148635 . https://doi.org/10.1016/j.apsusc.2020.148635
Spencer, B, Maniyarasu, S, Reed, B, Cant, D J H, Ahumada Lazo, R, Thomas, A, Muryn, C, Maschek, M, Eriksson, S K, Wiell, T, Lee, T L, Tougaard, S, Shard, G & Flavell, W 2021, ' Inelastic background modelling applied to Hard X-ray Photoelectron Spectroscopy of deeply buried layers: a comparison of synchrotron and lab-based (9.25 keV) measurements ', Applied Surface Science, vol. 541, 148635 . https://doi.org/10.1016/j.apsusc.2020.148635

Hard X-ray Photoelectron Spectroscopy (HAXPES) provides minimally destructive depth profiling into the bulk, extending the photoelectron sampling depth. Detection of deeply buried layers beyond the elastic limit is enabled through inelastic backgroun

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd35901ed344af9121ec639c8f28f10f
https://findresearcher.sdu.dk:8443/ws/files/175916022/1_s2.0_S0169433220333936_main.pdf

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Dissertation/ Thesis

Characterization of deeply buried interfaces by Hard X-ray Photoelectron Spectroscopy

Autor: Zborowski, Charlotte

Cette thèse vise à améliorer la méthode d'analyse du fond continu inélastique afin de l'appliquer à des cas qui présentent un intérêt technologique. En effet, ces améliorations sont cruciales car elles portent sur des critères de précisio

Externí odkaz: http://www.theses.fr/2018LYSEC025/document

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Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample

Autor: C. Zborowski, Olivier Renault, Geneviève Grenet, Sven Tougaard, Yoshiyuki Yamashita, A. Torres

Publikováno v: Zborowski, C, Renault, O, Torres, A, Yamashita, Y, Grenet, G & Tougaard, S 2018, ' Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample ', Applied Surface Science, vol. 432, no. Part A, pp. 60-70 . https://doi.org/10.1016/j.apsusc.2017.06.081
Applied Surface Science
Applied Surface Science, Elsevier, 2018, 432, pp.60-70. ⟨10.1016/j.apsusc.2017.06.081⟩
Applied Surface Science, 2018, 432, pp.60-70. ⟨10.1016/j.apsusc.2017.06.081⟩

International audience; The recent progress in HAXPES combined with Inelastic Background Analysis makes this method a powerful, non-destructive solution to get quantitative information on deeply buried layers and interfaces at depths up to 70 nm. How

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef69d5a7c7968d4effaff89c986ee170
https://portal.findresearcher.sdu.dk/da/publications/dd3262f4-12e7-4c0f-b62a-1beea6e5030b

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