Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Indris, Christopher"'
Autor:
Rahman, Raiyan, Indris, Christopher, Bramesfeld, Goetz, Zhang, Tianxiao, Li, Kaidong, Chen, Xiangyu, Grijalva, Ivan, McCornack, Brian, Flippo, Daniel, Sharda, Ajay, Wang, Guanghui
Aphid infestations are one of the primary causes of extensive damage to wheat and sorghum fields and are one of the most common vectors for plant viruses, resulting in significant agricultural yield losses. To address this problem, farmers often empl
Externí odkaz:
http://arxiv.org/abs/2405.04305
Autor:
Rahman, Raiyan, Indris, Christopher, Zhang, Tianxiao, Li, Kaidong, McCornack, Brian, Flippo, Daniel, Sharda, Ajay, Wang, Guanghui
Aphid infestations can cause extensive damage to wheat and sorghum fields and spread plant viruses, resulting in significant yield losses in agriculture. To address this issue, farmers often rely on chemical pesticides, which are inefficiently applie
Externí odkaz:
http://arxiv.org/abs/2307.10267
Autor:
Rahman R; Department of Computer Science, Toronto Metropolitan University, Toronto, ON M5B 2K3, Canada., Indris C; Department of Computer Science, Toronto Metropolitan University, Toronto, ON M5B 2K3, Canada., Bramesfeld G; Department of Aerospace Engineering, Toronto Metropolitan University, Toronto, ON M5B 2K3, Canada., Zhang T; Department of Electrical Engineering and Computer Science, University of Kansas, Lawrence, KS 66045, USA., Li K; Department of Electrical Engineering and Computer Science, University of Kansas, Lawrence, KS 66045, USA., Chen X; Department of Electrical Engineering and Computer Science, University of Kansas, Lawrence, KS 66045, USA., Grijalva I; Department of Entomology, Kansas State University, Manhattan, KS 66506-4004, USA., McCornack B; Department of Entomology, Kansas State University, Manhattan, KS 66506-4004, USA., Flippo D; Department of Biological and Agricultural Engineering, Kansas State University, Manhattan, KS 66506, USA., Sharda A; Department of Biological and Agricultural Engineering, Kansas State University, Manhattan, KS 66506, USA., Wang G; Department of Computer Science, Toronto Metropolitan University, Toronto, ON M5B 2K3, Canada.
Publikováno v:
Journal of imaging [J Imaging] 2024 May 08; Vol. 10 (5). Date of Electronic Publication: 2024 May 08.