[Participation in the community after the rehabilitation: multi-center study in Argentina]

Autor: Heider G; Santa Catalina Neurorehabilitacion Clinica. gusheider@gmail.com., Gonzalez Atchabahian L; lauriga2001@yahoo.com., Gambero Y; yaninagambero@hotmail.com., Herrera C; cristianherrera79@hotmail.com., Suárez S; sabsuarez@gmail.com., Sciuto S; silsciuto@hotmail.com., Sampayo MP; mariadelapaz.sampayo@csantacatalina.com.ar., Buffetti E; elybuffetti@yahoo.com.ar., Bonetto M; mbonetto@fleni.org.ar., Relancio MS; solerelancio@hotmail.com., Elorriaga MB; miriamelorriaga@gmail.com., Impagliazzo L; lcimpagliazzo@gmail.com., Solohaga J; juansolohaga@gmail.com., Estelita A; andresestelita@gmail.com., García G; dra_garcia@dinatos.com.ar., Leizica N; nadial_90@hotmail.com., Del Valle Mirabal D; mirabaldaiana@gmail.com., Cancino J; jorjejcancino@gmail.com., Pavón H; hmpvon@intramed.net., Toledo D; wdtoledo@gmail.com., Di Yorio R; rodrigodiyiorio@gmail.com.

Publikováno v: Revista de la Facultad de Ciencias Medicas (Cordoba, Argentina) [Rev Fac Cien Med Univ Nac Cordoba] 2022 Mar 07; Vol. 79 (1), pp. 19-25. Date of Electronic Publication: 2022 Mar 07.

Fault Behavior Observation of a Microprocessor System through a VHDL Simulation-Based Fault Injection Experiment

Autor: Amendola, A. M., Benso, A., Corno, F., Impagliazzo, L., Marmo, P., Prinetto, P., Rebaudengo, M., Matteo Sonza Reorda

Publikováno v: Scopus-Elsevier

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c89760c1ea9128bd4b32da4fdb33a2c7
http://hdl.handle.net/11583/2499924

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Fault behavior observation of a microprocessor system through a VHDL simulation-based fault injection experiment.

Autor: Prinetto, P., Benso, A., Corno, F., Rebaudengo, M., Sonza Reorda, M., Amendola, A., Impagliazzo, L., Marmo, P.

Publikováno v: Proceedings of the Conference: European Design Automation (9780818675737); 9/20/1996, p536-541, 6p

Fault-list collapsing for fault-injection experiments.

Autor: Benso, A., Rebaudengo, M., Impagliazzo, L., Marmo, P.

Publikováno v: Annual Reliability & Maintainability Symposium 1998 Proceedings International Symposium on Product Quality & Integrity; 1998, p383-388, 6p