Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Iljeok Kim"'
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-14 (2023)
Abstract Wafer map defect pattern classification is essential in semiconductor manufacturing processes for increasing production yield and quality by providing key root-cause information. However, manual diagnosis by field experts is difficult in lar
Externí odkaz:
https://doaj.org/article/8655f5a5d5d640998c7d56f44c3d988c
Publikováno v:
IEEE Transactions on Industrial Informatics. :1-10
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5644bbfbc787ac210e7f71617a13bd31
https://doi.org/10.1109/tii.2023.3268421
https://doi.org/10.1109/tii.2023.3268421
Publikováno v:
Journal of Mechanical Science and Technology. 35:1331-1342
Despite the sudden rise of AI, it still leaves a question mark to many newcomers on its widespread adoption as it exhibits a lack of robustness and interpretability. For instance, the insufficient amount of training data usually hinders its performan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3365c02a846f61040d2a2083898d7499
https://doi.org/10.1007/s12206-021-0342-5
https://doi.org/10.1007/s12206-021-0342-5
Publikováno v:
The Analyst. 145:1716-1723
We developed an electrolyte pre-deposition-based saliva pattern modulation method to detect ovulation with high accuracy and reliability. Ovulation tests using human saliva have advantages in terms of the earlier ovulation detection and more convenie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e8061a3da8c2966c107c2157ddea84e
https://doi.org/10.1039/c9an02169h
https://doi.org/10.1039/c9an02169h