Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Ikuo NANNO"'
Publikováno v:
Energies, Vol 16, Iss 23, p 7792 (2023)
Damage to photovoltaic power-generation systems by lightning causes the failure of bypass diodes (BPDs) in solar cell modules. Bypass diodes damaged by lightning experience high-resistance open- or short-circuit failures. When a bypass diode experien
Externí odkaz:
https://doaj.org/article/3cbff99046ca4898a96f7fb233d1c3cb
Publikováno v:
Energies, Vol 16, Iss 16, p 5879 (2023)
The bypass diode (BPD), a protective element in a photovoltaic system (PVS), occasionally fails as a result of lightning damage. In this study, using various resistance values, we investigated the burnout risk of PV modules experiencing BPD failures
Externí odkaz:
https://doaj.org/article/6be8abf1701443d3b247624a1fb83493
Publikováno v:
Japanese Journal of Applied Physics.
To clarify the mechanism of thermal runaway in solar cells, our study included experiments and simulations that focused on changes in the size of the shunt spot where thermal runaway occurs. Our analysis suggests that the rapid temperature increase o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9a0234cc80dac13ea791c92292eb6de
https://doi.org/10.35848/1347-4065/accfa4
https://doi.org/10.35848/1347-4065/accfa4
Autor:
Norio Ishikura, Masayuki Fujii, Tsukasa Uramatsu, Toshiyuki Hamada, Ikuo Nanno, Shinichiro Oke
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
One of the causes of global warming is carbon dioxide, and in recent years attention is being paid to solar energy as a clean energy measure. However, failures that cause the photovoltaic system to break due to lightning damage and lead to fires are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b3a23fbdeb1d82068af3dd9a6821a78
https://doi.org/10.1109/pvsc45281.2020.9300753
https://doi.org/10.1109/pvsc45281.2020.9300753
Autor:
Shuto Koyama, Toshiyuki Hamada, Norio Ishikura, Kunpei Yamamoto, Ikuo Nanno, Masayuki Fujii, Shinichiro Oke
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
The introduction of solar power generation systems has led to the need to diagnose PVS abnormalities for safety and economic reasons. Open failure of the bypass diode BPD is one such abnormality, in recent years, a method of inspecting the open failu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::933f61443e7c9b7e1d81b79497072eca
https://doi.org/10.1109/pvsc45281.2020.9300701
https://doi.org/10.1109/pvsc45281.2020.9300701
Autor:
Toshiyuki Hamada, Shinnosuke Yoneda, Ikuo Nanno, Shinichiro Oke, Norio Ishikura, Masayuki Fujii
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Lightning damage to a photovoltaic power generation system has been observed to cause the bypass diode (BPD) in a photovoltaic module to fail. If a BPD fails owing to a short circuit, the short-circuited current could then flow in a closed circuit co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b36b78017850b2ead81fb33a594becf5
https://doi.org/10.1109/pvsc45281.2020.9300361
https://doi.org/10.1109/pvsc45281.2020.9300361
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
In recent years, there has been an increasing number of cases involving damage to photovoltaic systems (PVS) due to lightning strikes. In a PVS that has been damaged by lightning, a protective device inside the photovoltaic module (PV module), i.e.,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bdde10c3f930fef327fbb24b4cd335f
https://doi.org/10.1109/pvsc45281.2020.9301020
https://doi.org/10.1109/pvsc45281.2020.9301020
Autor:
Toshiyuki Hamada, Ikuo Nanno, Takumi Kashiwaya, Masayuki Fujii, Shinichiro Oke, Kenta Nakamoto, Norio Ishikura
Publikováno v:
2019 8th International Conference on Renewable Energy Research and Applications (ICRERA).
Recently, failures in photovoltaic systems (PVSs) caused by lightning damage have been increasing. When lightning strikes a PVS, the bypass diode (BPD), which is a protection element in the solar cell module (PV-MDL), breaks down and burns out, rende
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f754833b27ef441500fb80676ff7a364
https://doi.org/10.1109/icrera47325.2019.8997019
https://doi.org/10.1109/icrera47325.2019.8997019
Autor:
Yudai Fujimoto, Ikuo Nanno, Shinichiro Oke, Kenta Nakamoto, Norio Ishikura, Masayuki Fujii, Toshiyuki Hamada, Takashi Oozeki
Publikováno v:
2019 8th International Conference on Renewable Energy Research and Applications (ICRERA).
Recently, failures in photovoltaic systems (PVSs) caused by lightning damage have been increasing. When lightning strikes a PVS, the bypass diode (BPD), which is a protection element in the solar cell module (PV-MDL), breaks down and burns out, rende
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8a510f79e24b845863e1767f4eda85f
https://doi.org/10.1109/icrera47325.2019.8996523
https://doi.org/10.1109/icrera47325.2019.8996523
Publikováno v:
2018 7th International Conference on Renewable Energy Research and Applications (ICRERA).
Since the use of photovoltaics in the domestic and industrial sector is increasing, the reliability and safety of photovoltaic power generation systems is becoming more and more important. One of the crucial issues for safety is the formation of a ho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46264a64f3b58537516bb6ba11a8ed1f
https://doi.org/10.1109/icrera.2018.8566926
https://doi.org/10.1109/icrera.2018.8566926