Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Ikuko Nakatani"'
Autor:
Ikuko Nakatani, Toshihide Agemura, Hiroaki Matsumoto, Shota Torikawa, Takahiro Sato, Masahiro Kiyohara, Yuka Aizawa, Takeshi Sunaoshi
Publikováno v:
Microscopy and Microanalysis. 23:1508-1509
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f0d522c13f6e8bd785f44f2fdd1536e
https://doi.org/10.1017/s1431927617008200
https://doi.org/10.1017/s1431927617008200
Autor:
Masaaki Yoshida, Ikuko Nakatani, Kiyoshi Yasutake, Heiji Watanabe, Kouji Iwasaki, Hirotaka Komoda, Y. Yamamoto
Publikováno v:
Microelectronics Reliability. 46:2085-2095
FIB-induced charging is one of the most critical issues for achieving successful circuit modifications of LSI. We have developed novel charge neutralization techniques applicable to a wide current range (from pico to nanoampere-order) of FIB processi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8b1c14e9bf328b179ab95f357b7511b
https://doi.org/10.1016/j.microrel.2006.01.014
https://doi.org/10.1016/j.microrel.2006.01.014
Autor:
Takahiro Furuta, Satoru Honma, Takeshi Kaneko, Takahiro Sonomura, Ikuko Nakatani, Yo Yamamoto
Publikováno v:
Microscopy (Oxford, England). 63
Ten years have passed since a serial block-face scanning electron microscopy (SBF-SEM) method was developed [1]. In this innovative method, samples were automatically sectioned with an ultramicrotome placed inside a scanning electron microscope colum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76e1448a66c8df6e06abd784a215d5bf
https://pubmed.ncbi.nlm.nih.gov/25359848
https://pubmed.ncbi.nlm.nih.gov/25359848
Publikováno v:
Journal of The Surface Finishing Society of Japan. 63:215
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10952e79461c0c1470a1028d0860f1c1
https://doi.org/10.4139/sfj.63.215
https://doi.org/10.4139/sfj.63.215
Publikováno v:
Japanese Journal of Applied Physics. 44:7907
We have developed a novel antistatic technique for suppressing focused ion beam (FIB)-induced charging in a combined system of an FIB and a scanning electron microscope. Microprobing and FIB-assisted carbon deposition are utilized to make a current p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7601f8ccd0c6fa3f6c04c203ab547ece
https://doi.org/10.1143/jjap.44.7907
https://doi.org/10.1143/jjap.44.7907
Autor:
Yuka Aizawa, Takahiro Sato, Takeshi Sunaoshi, Hiroaki Matsumoto, Toshihide Agemura, Shota Torikawa, Ikuko Nakatani, Masahiro Kiyohara
Publikováno v:
Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p1508-1509, 2p, 1 Color Photograph, 2 Black and White Photographs