Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Ijeoma Sandra Irobi"'
Publikováno v:
Asian Test Symposium
Due to rapid and continuous technology scaling, faults in semiconductor memories (and ICs in general) are becoming pervasive and weak rather than strong, a weak fault is a fault that escape the test program (because it does not cause an error/system
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22744b0e3354c09d4c81229a59c9d06e
