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© Article author(s) (or their employer(s) unless otherwise stated in the text of the article) 2017. All rights reserved. Background Networked organised systems of care for patients with major trauma now exist in many countries, designed around the n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::8702713a69b583cdf3155be789620703
https://eprints.whiterose.ac.uk/123309/8/Major_Trauma_from_Suspected_Child_Abuse_patient_journey_revised_clean_copy.pdf
https://eprints.whiterose.ac.uk/123309/8/Major_Trauma_from_Suspected_Child_Abuse_patient_journey_revised_clean_copy.pdf
Publikováno v:
Emergency medicine journal : EMJ. 34(9)
Background Networked organised systems of care for patients with major trauma now exist in many countries, designed around the needs of the majority of patients (90% adults). Non-accidental injury is a significant cause of paediatric major trauma and
Autor:
Dmitry Veksler, A. Cerdeira, Magali Estrada, Rodrigo Picos, B. Iiguez, Michael Shur, Warren B. Jackson, Trond Ytterdal, Alexey Koudymov
Publikováno v:
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems.
We review recent physics-based, compact models for thin film transistors (TFTs), including amorphous (a-Si), polysilicon (poly-Si), nanocrystalline silicon (nc-Si), and organic TFTs. The models accurately reproduce the DC characteristics for differen
Publikováno v:
Laryngo-Rhino-Otologie. 82
Autor:
Rodolfo Garcia, Benjamin Iiguez, M. J. Deen, Joaquim Puigdollers, Cristobal Voz, Magali Estrada
Publikováno v:
ECS Meeting Abstracts. :1595-1595
not Available.
Autor:
Iiguez, B.
Publikováno v:
2009 Compact Thin-Film Transistor Modeling for Circuit Simulation; 2009, p1-60, 60p
Autor:
Castro-Carranza, A., Estrada, M., Cerdeira, A., Nolasco, J.C., Deen, J., Picos, R., Iiguez, B., Pallares, J.
Publikováno v:
2009 Compact Thin-Film Transistor Modeling for Circuit Simulation; 2009, p1-22, 22p
Publikováno v:
2009 Spanish Conference on Electron Devices; 2009, p81-84, 4p
Publikováno v:
2007 Spanish Conference on Electron Devices; 2007, p64-67, 4p