Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Ihab Alshaer"'
Publikováno v:
HAL
With the increasing complexity of digital applications, the use of variable-length instruction sets became essential, in order to achieve higher code density and thus better performance. However, security aspects must always be considered, in particu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf642c17e58a099eb223f05e37b63d35
https://hal.archives-ouvertes.fr/hal-03775870
https://hal.archives-ouvertes.fr/hal-03775870
Publikováno v:
Microelectronics Reliability. 139:114841
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2609bf8ce9f0fe82c02bc13a87ec5b5
https://doi.org/10.1016/j.microrel.2022.114841
https://doi.org/10.1016/j.microrel.2022.114841
Publikováno v:
International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS 2021)
International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS 2021), Jun 2021, Apulia (virtual), Italy
DTIS
International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS 2021), Jun 2021, Apulia (virtual), Italy
DTIS
Fault injection attacks are considered one of the major threats to cyber-physical systems. The increasing complexity of embedded microprocessors involves complicated behaviours in presence of such attacks. Realistic fault models are required to study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb175b10001dc8f1a5847b01438aeb0a
https://hal.archives-ouvertes.fr/hal-03272932/document
https://hal.archives-ouvertes.fr/hal-03272932/document
Autor:
Naofumi Homma, Amir Ali Pour, Ihab Alshaer, Seetal Potluri, Ville Yli-Mayry, David Hely, Paul D. Franzon, Dirmanto Jap, Aydin Aysu, Priyank Kashyap, Ilia Polian, Elena Ioana Vatajelu, Furkan Aydin, Giorgio Di Natale, Rei Ueno, Vincent Beroulle, Francesco Regazzoni, Shivam Bhasin, Akira Ito
Publikováno v:
ICCAD
International Conference on Computer-Aided Design (ICCAD 2020)
International Conference on Computer-Aided Design (ICCAD 2020), Nov 2020, San Diego, United States
HAL
International Conference on Computer-Aided Design (ICCAD 2020)
International Conference on Computer-Aided Design (ICCAD 2020), Nov 2020, San Diego, United States
HAL
International audience; Machine learning techniques have significantly changed our lives. They helped improving our everyday routines, but they also demonstrated to be an extremely helpful tool for more advanced and complex applications. However, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e6a550466cc7f2f720d805c419bc5bf3
https://hdl.handle.net/10356/147418
https://hdl.handle.net/10356/147418