Zobrazeno 1 - 10
of 135
pro vyhledávání: '"Igor V. Kozhevnikov"'
Autor:
Runze Qi, Qiushi Huang, Jiani Fei, Igor V. Kozhevnikov, Yang Liu, Pin Li, Zhong Zhang, Zhanshan Wang
Publikováno v:
Materials, Vol 12, Iss 18, p 2936 (2019)
Cr/V multilayer mirrors are suitable for applications in the “water window” spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses varying from 0.6 nm
Externí odkaz:
https://doaj.org/article/20ce8539c3f34164a519feb7ecaceed5
Publikováno v:
Optics express, 28(3), 3331-3351. The Optical Society
We present a general method for designing XUV aperiodic multilayer mirrors that can mimic a given target spectrum, specifically, the spectral transmission of an XUV optical system. The method is based on minimizing a merit function and using fidelity
Publikováno v:
Optics express. 28(21)
We demonstrate a theoretical approach whereby light backscattering toward the incident beam can be suppressed entirely for a high-reflectivity, rough-surfaced multilayer mirror fabricated using oblique deposition, such that the interface relief is re
Autor:
Zhanshan Wang, Jiangtao Feng, Andrey Sokolov, Qiushi Huang, Zhong Zhang, Jens Viefhaus, Igor V. Kozhevnikov, Yeqi Zhuang, Frank Siewert, Tongzhou Li
Publikováno v:
Optics express. 28(2)
The problem of X-ray diffraction from multilayer-coated blazed diffraction gratings is analyzed. Invalidity of the conventional condition of maximal diffraction efficiency observed in previous experiments is explained theoretically. This is attribute
Autor:
Qiushi Huang, Runze Qi, Yingyu Liao, Andrey Sokolov, Zhong Zhang, Zhuangzhuang Zhang, Yang Yang, Igor V. Kozhevnikov, Zhanshan Wang
Effective area is one of the most important parameters of x ray telescopes. It can be increased by enlarging the entrance aperture or maximizing the reflectivity through the proper designing and optimization of the reflecting coating. A method to inc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::595ce78053d803ce7b85275e65870bc3
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=102703
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=102703
Autor:
Igor V. Kozhevnikov
Publikováno v:
Optics Communications. 504:127467
The reflection and transmission of a wave falling onto a stratified medium is analyzed in terms of the RT-matrixes establishing a relation between the wave amplitudes in the asymptotic regions z → ± ∞ . The RT-matrixes are considered as a genera
Autor:
Frederik Bijkerk, Hubertus M.J. Bastiaens, Muharrem Bayraktar, Igor V. Kozhevnikov, J.L.P. Barreaux, Klaus-Jochen Boller, R. W. E. van de Kruijs
Publikováno v:
Optics express, 25(3), 1993-2008. The Optical Society
We present the first experimental demonstration of a novel type of narrowband and wavelength-tunable multilayer transmission filter for the extreme ultraviolet (EUV) region. The operating principle of the filter is based on spatially overlapping the
Autor:
Zhong Zhang, Zhanshan Wang, Runze Qi, Igor V. Kozhevnikov, Jiani Fei, Pin Li, Qiushi Huang, Yang Liu
Publikováno v:
Materials, Vol 12, Iss 18, p 2936 (2019)
Materials
Volume 12
Issue 18
Materials
Volume 12
Issue 18
Cr/V multilayer mirrors are suitable for applications in the &ldquo
water window&rdquo
spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses var
water window&rdquo
spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses var
Publikováno v:
Optics express. 27(11)
We theoretically demonstrate the possibility of entirely suppressing light backscattering towards the incident beam from a rough bilayer fabricated by deposition at an oblique angle, such that the substrate relief is replicated at a certain angle to
Publikováno v:
Science and Technology of Advanced Materials, Vol 13, Iss 1, p 015001 (2012)
We developed a mathematical analysis method of reflectometry data and used it to characterize the internal structure of TiO2/SiO2/Si and Ti/SiO2/Si stacks. Atomic concentration profiles of all the chemical elements composing the samples were reconstr
Externí odkaz:
https://doaj.org/article/b63beccaca9344f4967fa1c64192694a