Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Igor Makhotkin"'
Autor:
Najmeh Abbasirad, Qais Saadeh, Richard Ciesielski, Alexander Gottwald, Vicky Philipsen, Igor Makhotkin, Andrey Sokolov, Michael Kolbe, Frank Scholze, Victor Soltwisch
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Publikováno v:
Materials, 15(15):5193. MDPI
Materials; Volume 15; Issue 15; Pages: 5193
Materials 15(15), 5193 (2022). doi:10.3390/ma15155193
Materials; Volume 15; Issue 15; Pages: 5193
Materials 15(15), 5193 (2022). doi:10.3390/ma15155193
Materials 15(15), 5193 (2022). doi:10.3390/ma15155193
Ultrafast laser irradiation of metals can often be described theoretically with the two-temperature model. The energy exchange between the excited electronic system and the atomic one is gove
Ultrafast laser irradiation of metals can often be described theoretically with the two-temperature model. The energy exchange between the excited electronic system and the atomic one is gove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7ea2d99eab43bcbf04d0e0f1326b78a7
https://research.utwente.nl/en/publications/4c548b03-05c9-4d2c-ad0d-638f4346220c
https://research.utwente.nl/en/publications/4c548b03-05c9-4d2c-ad0d-638f4346220c
Autor:
Claudia Fleischmann, Ramya Cuduvally, Davit Melkonyan, Igor Makhotkin, Jonathan Op de Beeck, Richard V. Morris, Paul van der Heide, Wilfried Vandervorst
Publikováno v:
Microscopy and Microanalysis. 25:312-313
Publikováno v:
University of Twente Research Information (Pure Portal)
Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crys
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ddba247393915b67c6201283d93796b6
https://research.utwente.nl/en/publications/d485d807-52b2-4004-8fc3-afa1ee2d6cb2
https://research.utwente.nl/en/publications/d485d807-52b2-4004-8fc3-afa1ee2d6cb2
Autor:
Kevin Dorney, Nicola N. Kissoon, Fabian Holzmeier, Esben W. Larsen, Dhirendra P. Singh, Shikhar Arvind, Sayantani Santra, Roberto Fallica, Igor Makhotkin, Vicky Philipsen, Stefan De Gendt, Claudia Fleischmann, Paul A. W. van der Heide, John S. Petersen
Publikováno v:
Optical and EUV Nanolithography XXXVI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8bc1e85f4359e78259f8cf54e6d9a34c