Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle x-ray scattering

Autor: Dendooven, Jolien, Devloo-Casier, Kilian, Ide, Matthias, Grandfield, Kathryn, Kurttepeli, Mert, Ludwig, Karl F., Bals, Sara, Van Der Voort, Pascal, Detavernier, Christophe

Publikováno v: Nanoscale, 2014,6, 14991-14998

Atomic layer deposition (ALD) enables the conformal coating of porous materials, making the technique suitable for pore size tuning at the atomic level, e.g., for applications in catalysis, gas separation and sensing. It is, however, not straightforw

Externí odkaz: http://arxiv.org/abs/1502.07231

The next generation of hydrolytically stable packing materials : organic/inorganic hybrids

Autor: Ide, Matthias, Lynen, Frederic, Van Der Voort, Pascal

Publikováno v: 13th International symposium on Hyphenated Techniques in Chromatography and Separation Technology (HTC-13) and 3rd International symposium on Hyphenated Techniques for Sample Preparation (HTSP-3), Book of abstracts

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______330::ac98b0a36671b626cbd74a9ec0749d5f
https://hdl.handle.net/1854/LU-5722858

Quantification of silanol sites for the most common mesoporous ordered silicas and organosilicas: total versus accessible silanols

Autor: THIBAULT-STARZYK, FREDERIC, Ide, Matthias, El-Roz, Mohamad, De Canck, Els, Vicente, Aurélie, Planckaert, Tom, Bogaerts, Thomas, Van Driessche, Isabel, Lynen, Frederic, Van Speybroeck, Veronique, Thybault-Starzyk, Frédéric, Van Der Voort, Pascal

Publikováno v: Physical Chemistry Chemical Physics
Physical Chemistry Chemical Physics, Royal Society of Chemistry, 2013, 15 (2), pp.642-650. ⟨10.1039/c2cp42811c⟩
Phys. Chem. Chem. Phys.

IR and NMR spectroscopy were used to determine the silanol content in the most common mesoporous ordered silicas: MCM-41, MCM-48, SBA-15 and SBA-16. In addition, a spray dried MCM-41 and an ethene bridged PMO are investigated. The results are compare

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef9c319db2ae1f917b7936c0a940f623
https://hal.archives-ouvertes.fr/hal-01831402

In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering

Autor: Dendooven, Jolien, Devloo-Casier, Kilian, Ide, Matthias, Grandfield, Kathryn, Ludwig, Karl, Van Der Voort, Pascal, Bals, Sara, Detavernier, Christophe

Publikováno v: Synchrotron and Neutron Workshop, Abstracts

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______330::c7322c6dc686e4f74015ef12fc9eff08
https://hdl.handle.net/1854/LU-4360856

Ordered mesoporous silica materials in liquid chromatography : synthesis and application

Autor: Ide, Matthias

This research work describes the synthesis and application of ordered mesoporous silica materials in liquid chromatography. For this purpose spherical particles and thick layers were developed. In a first part the synthesis and the particle propertie

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______330::185585cdfaf7c2c81fe3dcf52acf3d94
https://hdl.handle.net/1854/LU-2072660