Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Icel, A.B."'
Publikováno v:
2010 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2010, p188-191, 4p
Autor:
Qiang Chen, Balasubramanian, S., Thuruthiyil, C., Gupta, M., Wason, V., Subba, N., Jung-Suk Goo, Chiney, P., Krishnan, S., Icel, A.B.
Publikováno v:
2008 9th International Conference on Solid-State & Integrated-Circuit Technology; 2008, p448-451, 4p
Autor:
Qiang Chen, Zhi-Yuan Wu, Ly, T., Gupta, M., Wason, V., Jung-Suk Goo, Thuruthiyil, C., Radwin, M., Subba, N., Chiney, P., Suryagandh, S., Icel, A.B.
Publikováno v:
2008 9th International Conference on Solid-State & Integrated-Circuit Technology; 2008, p284-287, 4p
Autor:
Qiang Chen, Jung-Suk Goo, Tran Ly, Chandrasekaran, K., Zhi-Yuan Wu, Thuruthiyil, C., Icel, A.B.
Publikováno v:
2008 9th International Conference on Solid-State & Integrated-Circuit Technology; 2008, p301-304, 4p
Autor:
Suryagandh, S., Gupta, M., Zhi-Yuan Wu, Krishnan, S., Pelella, M., Jung-Suk Goo, Thuruthiyil, C., An, J.X., Chen, B.Q., Subba, N., Zamudio, L., Yonemura, J., Icel, A.B.
Publikováno v:
ESSDERC 2007 - 37th European Solid State Device Research Conference; 2007, p119-122, 4p
Autor:
Qiang Chen, Zhi-Yuan Wu, Su, R.Y.K., Jung-Suk Goo, Thuruthiyil, C., Radwin, M., Subba, N., Suryagandh, S., Tran Ly, Wason, V., An, J.X., Icel, A.B.
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p272-275, 4p
Autor:
Goo, J.-S., An, J.X., Thuruthiyil, C., Ly, T., Chen, Q., Radwin, M., Zhi-Yuan Wu, Lee, M.S.L., Zamudio, L., Yonemura, J., Assad, F., Pelella, M.M., Icel, A.B.
Publikováno v:
2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573); 2004, p156-158, 3p
Autor:
Jia Feng, Loke, A.L.S., Tin Tin Wee, Lackey, C.O., Okada, L.A., Schwan, C.T., Mantei, T., Morgan, J.H., Herden, M.M., Cooper, J.G., Zhi-Yuan Wu, Jung-Suk Goo, Xin Li, Icel, A.B., Bair, L.A., Fischette, D.M., Doyle, B.A., Fang, E.S., Leary, B.M., Krishnan, S.
Publikováno v:
2011 Symposium on VLSI Technology (VLSIT); 2011, p226-227, 2p
Autor:
Goo, J.-S., Chen, Q., Pandey, A., Apanovich, Y., Ly, T., Wason, V., Subba, N., Thuruthiyil, C., Icel, A.B.
Publikováno v:
2008 IEEE International SOI Conference; 2008, p153-154, 2p
Conference
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