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pro vyhledávání: '"Ian Zachary Wilcox"'
Publikováno v:
Scientific Computing in Electrical Engineering ISBN: 9783319755373
Uncertainty Quantification (UQ) is an important and emerging topic in electronic design automation (EDA), as parametric uncertainties are a significant concern for the design of integrated circuits. Historically, various sampling methods such as Mont
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07eb17c00dce3e19ce502c2d81b47db9
https://doi.org/10.1007/978-3-319-75538-0_6
https://doi.org/10.1007/978-3-319-75538-0_6
Autor:
Ian Zachary Wilcox, Dolores A. Black, William H. Robinson, Jeffrey D. Black, Daniel B. Limbrick
Publikováno v:
IEEE Transactions on Nuclear Science. 62:1540-1549
Single event effects (SEE) are a reliability concern for modern microelectronics. Bit corruptions can be caused by single event upsets (SEUs) in the storage cells or by sampling single event transients (SETs) from a logic path. An accurate prediction