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pro vyhledávání: '"Ian T. Muirhead"'
Autor:
Ian T. Muirhead, A. G. Cullis, Alan Miller, K.L. Lewis, T. J. Wyatt-Davies, A. M. Pitt, NG Chew
Publikováno v:
Applied optics. 28(14)
Significant improvements can be made in the fabrication of optical thin film structures by using molecular beam and ultrahigh vacuum techniques. These lead to the achievement of more stable films and multilayer coatings with improved morphology, dens
Autor:
Paul Meredith, Gerald S. Buller, Andrew C. Walker, S. Desmond Smith, Ian T. Muirhead, Shari Powell Fisher, John F. Leonard, Jim L. Orr
Publikováno v:
Optical Interference Coatings.
Optically bistable nonlinear interference filter (NLEF) structures have been used as logic, memory or threshold devices in the field of digital optical computing. They operate via a temperature dependent refractive index change of the spacer [1]. Mat
Autor:
Shari Powell Fisher, John Gordon H. Mathew, Ian T. Muirhead, Christopher C.H. Hale, Robert J. Cornwell
Publikováno v:
SPIE Proceedings.
A broadband optical monitoring system to assist with the control of complex filter designs has been implemented on a newly installed Molecular Beam Deposition (MBD) facility which has been adapted for the growth of optical thin films. When depositing
Publikováno v:
SPIE Proceedings.
Trends in optical thin film interference filters have created an increasing demand for the production of high tolerance designs for a wide number of applications. Much has been achieved by conventional filter designs but more novel structures such as
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 7:1413-1419
Significant improvements can be made in the fabrication of optical thin‐film structures by using molecular‐beam and ultrahigh vacuum techniques. These lead to the achievement of more stable films and multilayer coatings, with improved morphology,
Publikováno v:
Applied Optics. 28:2796
Ultrahigh vacuum and molecular beam deposition techniques have been used to fabricate ZnSe interference filters. These demonstrate optical bistability with critical switching power being measured at five wavelengths between 521 and 676 nm. These filt
Conference
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