Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems

Autor: Enrico G. Keim, Andrey E. Yakshin, Erwin Zoethout, Aart W. Kleyn, Franz Schäfers, H. H. Brongersma, V.I.T.A. de Rooij-Lohmann, M. Gorgoi, Frederik Bijkerk, R. W. E. van de Kruijs

Publikováno v: Journal of Applied Physics, 108, 5
Journal of Applied Physics, 108(1):014314, 014314/1-014314/5. American Institute of Physics

The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantane

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::151647a5f8dd7cc404625a76a3aab5ed
https://doi.org/10.1063/1.3460107