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Autor:
G. Julius Vancso, Simon Flink, David N. Reinhoudt, Frank C. J. M. van Veggel, Holger Schönherr, Frank A. J. Geurts, Kees van Leerdam
Publikováno v:
Journal of the Chemical Society. Perkin transactions II, 2000(10), 2141-2146. Chemical Society
X-Ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) have been used to study the interactions between self-assembled monolayers (SAMs) of crown ether adsorbates and metal ions. Both analytical techniques confirmed the selectivitie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1df8e3c653db728ffdd737bce854bec8
https://doi.org/10.1039/b002606i
https://doi.org/10.1039/b002606i
