Zobrazeno 1 - 4
of 4
pro vyhledávání: '"IMAGERIE RETINE"'
Autor:
Lai-Tim, Yann, Mugnier, Laurent, Orieux, François, Baena-Gallé, Roberto, Paques, Michel, Meimon, Serge
Publikováno v:
Optics Express
Optics Express, Optical Society of America-OSA Publishing, 2019, 27 (23), pp.33251-33267. ⟨10.1364/OE.27.033251⟩
Optics Express, Optical Society of America-OSA Publishing, 2019, 27 (23), pp.33251-33267. ⟨10.1364/OE.27.033251⟩
International audience; Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy. It consists in illuminating the sample with periodic patterns at d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______212::869ae98adabe7e54dfe33688f66bc019
https://hal.archives-ouvertes.fr/hal-02388773/file/DOTA19220.1570465530.pdf
https://hal.archives-ouvertes.fr/hal-02388773/file/DOTA19220.1570465530.pdf
Autor:
Yann Lai-Tim, Laurent Mugnier, François Orieux, Roberto Baena-Gallé, Michel Paques, Serge Meimon
Publikováno v:
GRETSI 2019
GRETSI 2019, Aug 2019, LILLE, France
HAL
GRETSI 2019, Aug 2019, LILLE, France
HAL
International audience; Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy using dedicated reconstruction algorithms. In this communication we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::2febca5fa4ebfb62a2fa8079949898b1
https://hal.archives-ouvertes.fr/hal-02409638
https://hal.archives-ouvertes.fr/hal-02409638
Autor:
Lai-Tim, Yann, Mugnier, Laurent, Orieux, François, Baena-Gallé, Roberto, Paques, Michel, Meimon, Serge
Publikováno v:
Optics Express
Optics Express, Optical Society of America-OSA Publishing, 2019, 27 (23), pp.33251-33267. ⟨10.1364/OE.27.033251⟩
Optics Express, Optical Society of America-OSA Publishing, 2019, 27 (23), pp.33251-33267. ⟨10.1364/OE.27.033251⟩
Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy. It consists in illuminating the sample with periodic patterns at different orientations an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2992a5ad0545203321f35d972350a5e5
Autor:
Lai-Tim, Yann, Mugnier, Laurent, Orieux, François, Baena-Gallé, Roberto, Paques, Michel, Meimon, Serge
Publikováno v:
GRETSI 2019
GRETSI 2019, Aug 2019, LILLE, France
GRETSI 2019, Aug 2019, LILLE, France
Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy using dedicated reconstruction algorithms. In this communication we focus on the very promi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::45769d75a984089fbe79c19b962dd342
https://hal.science/hal-02409638
https://hal.science/hal-02409638