Zobrazeno 1 - 10
of 3 056
pro vyhledávání: '"ILIC, B."'
Autor:
Elliott, Lindsay C. C., Pintar, Adam L., Copeland, Craig R., Renegar, Thomas B., Dixson, Ronald G., Ilic, B. Robert, Verkouteren, R. Michael, Stavis, Samuel M.
Publikováno v:
Analytical Chemistry, 94, 2, 678-686 (2022)
Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance and integrate these complementary methods, introducing simultaneous mea
Externí odkaz:
http://arxiv.org/abs/2109.09455
Autor:
Copeland, Craig R., Pintar, Adam L., Dixson, Ronald G., Chanana, Ashish, Srinivasan, Kartik, Westly, Daron A., Ilic, B. Robert, Davanco, Marcelo I., Stavis, Samuel M.
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localization microscopy, establishing a metrological foundation for the maturati
Externí odkaz:
http://arxiv.org/abs/2106.10221
Autor:
Liao, Kuo-Tang, Madison, Andrew C., Pintar, Adam L., Ilic, B. Robert, Copeland, Craig R., Stavis, Samuel M.
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these challenges, we advance a lateral nanoflow assay that integrates complex n
Externí odkaz:
http://arxiv.org/abs/2101.03881
Autor:
Madison, Andrew C., Villarrubia, John S., Liao, Kuo-Tang, Copeland, Craig R., Schumacher, Joshua, Siebein, Kerry, Ilic, B. Robert, Liddle, J. Alexander, Stavis, Samuel M.
Focused-ion-beam machining is a powerful process to fabricate complex nanostructures, often through a sacrificial mask that enables milling beyond the resolution limit of the ion beam. However, current understanding of this super-resolution effect is
Externí odkaz:
http://arxiv.org/abs/2012.01678
Publikováno v:
Nature Communications, 12, 3925 (2021)
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this stan
Externí odkaz:
http://arxiv.org/abs/2009.01170
Autor:
Newman, Z. L., Maurice, V., Drake, T. E., Stone, J. R., Briles, T. C., Spencer, D. T., Fredrick, C., Li, Q., Westly, D., Ilic, B. R., Shen, B., Suh, M. -G., Yang, K. Y., Johnson, C., Johnson, D. M. S., Hollberg, L., Vahala, K., Srinivasan, K., Diddams, S. A., Kitching, J., Papp, S. B., Hummon, M. T
Laboratory optical atomic clocks achieve remarkable accuracy (now counted to 18 digits or more), opening possibilities to explore fundamental physics and enable new measurements. However, their size and use of bulk components prevent them from being
Externí odkaz:
http://arxiv.org/abs/1811.00616
Autor:
Zhelev, N., Abhilash, T. S., Bennett, R. G., Smith, E. N., Ilic, B., Parpia, J. M., Levitin, L. V., Rojas, X., Casey, A., Saunders, J.
We demonstrate the fabrication of $\sim$1.08 $\mu$m deep microfluidic cavities with characteristic size as large as 7 mm $\times$ 11 mm or 11 mm diameter, using a silicon$-$glass anodic bonding technique that does not require posts to act as separato
Externí odkaz:
http://arxiv.org/abs/1805.00958
Publikováno v:
In Micro and Nano Engineering August 2022 16
Autor:
Copeland, Craig R., Geist, Jon, McGray, Craig D., Aksyuk, Vladimir A., Liddle, J. Alexander, Ilic, B. Robert, Stavis, Samuel M.
Publikováno v:
Light: Science & Applications, volume 7, Article number: 31 (2018)
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with nanoscale sta
Externí odkaz:
http://arxiv.org/abs/1710.09803
Autor:
Spencer, Daryl T., Drake, Tara, Briles, Travis C., Stone, Jordan, Sinclair, Laura C., Fredrick, Connor, Li, Qing, Westly, Daron, Ilic, B. Robert, Bluestone, Aaron, Volet, Nicolas, Komljenovic, Tin, Chang, Lin, Lee, Seung Hoon, Oh, Dong Yoon, Suh, Myoung-Gyun, Yang, Ki Youl, Pfeiffer, Martin H. P., Kippenberg, Tobias J., Norberg, Erik, Theogarajan, Luke, Vahala, Kerry, Newbury, Nathan R., Srinivasan, Kartik, Bowers, John E., Diddams, Scott A., Papp, Scott B.
Integrated-photonics microchips now enable a range of advanced functionalities for high-coherence applications such as data transmission, highly optimized physical sensors, and harnessing quantum states, but with cost, efficiency, and portability muc
Externí odkaz:
http://arxiv.org/abs/1708.05228