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pro vyhledávání: '"III2-VI3 semiconductor materials"'
Autor:
Puja Pradhan, Puruswottam Aryal, Dinesh Attygalle, Abdel-Rahman Ibdah, Prakash Koirala, Jian Li, Khagendra P. Bhandari, Geethika K. Liyanage, Randy J. Ellingson, Michael J. Heben, Sylvain Marsillac, Robert W. Collins, Nikolas J. Podraza
Publikováno v:
Materials, Vol 11, Iss 1, p 145 (2018)
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency t
Externí odkaz:
https://doaj.org/article/db309d8b3f814c638c2360c60de83e97
Autor:
Randy J. Ellingson, Prakash Koirala, Robert W. Collins, Michael J. Heben, Khagendra P. Bhandari, Sylvain Marsillac, Nikolas J. Podraza, Geethika K. Liyanage, Abdel-Rahman Ibdah, Puruswottam Aryal, Dinesh Attygalle, Puja Pradhan, Jian Li
Publikováno v:
Materials; Volume 11; Issue 1; Pages: 145
Materials, Vol 11, Iss 1, p 145 (2018)
Materials
Materials, Vol 11, Iss 1, p 145 (2018)
Materials
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54259138c8412c13f53712bf0c43b32e
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