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pro vyhledávání: '"III2-VI3 semiconductor materials"'
Autor:
Puja Pradhan, Puruswottam Aryal, Dinesh Attygalle, Abdel-Rahman Ibdah, Prakash Koirala, Jian Li, Khagendra P. Bhandari, Geethika K. Liyanage, Randy J. Ellingson, Michael J. Heben, Sylvain Marsillac, Robert W. Collins, Nikolas J. Podraza
Publikováno v:
Materials, Vol 11, Iss 1, p 145 (2018)
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency t
Externí odkaz:
https://doaj.org/article/db309d8b3f814c638c2360c60de83e97
Autor:
Randy J. Ellingson, Prakash Koirala, Robert W. Collins, Michael J. Heben, Khagendra P. Bhandari, Sylvain Marsillac, Nikolas J. Podraza, Geethika K. Liyanage, Abdel-Rahman Ibdah, Puruswottam Aryal, Dinesh Attygalle, Puja Pradhan, Jian Li
Publikováno v:
Materials; Volume 11; Issue 1; Pages: 145
Materials, Vol 11, Iss 1, p 145 (2018)
Materials
Materials, Vol 11, Iss 1, p 145 (2018)
Materials
Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency t
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Autor:
Pradhan, Puja1 puja.pradhan@rockets.utoledo.edu, Aryal, Puruswottam1, Attygalle, Dinesh1, Ibdah, Abdel-Rahman1, Koirala, Prakash1, Li, Jian1, Bhandari, Khagendra P.1, Liyanage, Geethika K.1, Ellingson, Randy J.1, Heben, Michael J.1, Marsillac, Sylvain2 smarsill@odu.edu, Collins, Robert W.1, Podraza, Nikolas J.1 Nikolas.Podraza@utoledo.edu
Publikováno v:
Materials (1996-1944). Jan2018, Vol. 11 Issue 1, p145. 33p. 2 Color Photographs, 1 Diagram, 7 Charts, 14 Graphs.