Zobrazeno 1 - 10
of 226
pro vyhledávání: '"I.S.T. Tsong"'
Publikováno v:
Surface Science Letters. 256:A542
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2902e82c6f80b14377bae47067e15ab
https://doi.org/10.1016/0167-2584(91)91190-8
https://doi.org/10.1016/0167-2584(91)91190-8
Autor:
C. S. Chang, I.S.T. Tsong
Publikováno v:
Journal of the American Ceramic Society. 73:3134-3134
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::108b5a7e81efb480905fb1fc7e278b98
https://doi.org/10.1111/j.1151-2916.1990.tb06429.x
https://doi.org/10.1111/j.1151-2916.1990.tb06429.x
Autor:
I.S.T Tsong
Publikováno v:
Surface Science. 69:609-618
The excitation efficiency of sputtered atoms, defined as the ratio of the number of atoms created in a particular excited state to that in the ground state, is studied using a thermodynamic equilibrium model. The intensities of emission lines from Ni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f650446bbef783b64ab3a02acb73e08
https://doi.org/10.1016/0039-6028(77)90136-4
https://doi.org/10.1016/0039-6028(77)90136-4
Autor:
I.S.T. Tsong, R.B. Liebert
Publikováno v:
Nuclear Instruments and Methods. 149:523-527
The line radiation emitted from sputtered atoms has been used for the analysis of hydrogen content in a variety of materials. Direct comparison of hydrogen concentrations can be made effectively by normalizing the H6563 line intensities to the most p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d85aa3ec408b5940fa96fde9684d7cf
https://doi.org/10.1016/0029-554x(78)90920-5
https://doi.org/10.1016/0029-554x(78)90920-5
Publikováno v:
Vacuum. 39:1195-1199
The technique of impact-collision ion scattering spectrometry (ICISS) was used to determine the in-plane geometries of the (a) Si (111)−(√3×√3) Ag and (b) Si (111)− Ni surfaces. For Si (111)−(√3×√3) Ag , comparison of experimental dat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed910f9db9507df82bddf52b6261b204
https://doi.org/10.1016/0042-207x(89)91120-2
https://doi.org/10.1016/0042-207x(89)91120-2
Autor:
Bruce V. King, I.S.T. Tsong
Publikováno v:
Nuclear Instruments and Methods in Physics Research. 218:687-690
Al/Si multilayers deposited on an Si substrate have been profiled with 3–7 keV Kr+, Ar+, Ar+ and Ne+ ions. The measured marker broadening agrees with the predictions of Littmark and Hofer for 5 keV Ar+ sputtering of Si. Comparisons with the cascade
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6aade22bf94541aadb777661ce49fd8
https://doi.org/10.1016/0167-5087(83)91066-9
https://doi.org/10.1016/0167-5087(83)91066-9
Publikováno v:
Nuclear Instruments and Methods in Physics Research. 218:340-346
A series of CuNi alloys have been sputtered by Ar+ and also He+ ion beams. SIMS, SIPS and ISS measurements were made from these alloys under ultra high vacuum, as well as in different oxygen ambients, to study the effect of oxygen on these techniq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b42f284236b74a477d4c394d2998bee1
https://doi.org/10.1016/0167-5087(83)91004-9
https://doi.org/10.1016/0167-5087(83)91004-9
Publikováno v:
Journal of Non-Crystalline Solids. 49:201-207
During the thermal oxidation of silicon in atmospheres containing oxygen and chlorine or oxygen and hydrogen chloride, an interfacial phase is formed between the silicon and its oxide. In addition, chlorine is incorporated into the oxide near the int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71a57a290dd474a33682a40606da8070
https://doi.org/10.1016/0022-3093(82)90119-3
https://doi.org/10.1016/0022-3093(82)90119-3
Publikováno v:
Nuclear Instruments and Methods in Physics Research. 218:742-746
We discuss the kinetic energy distributions of sputtered particles predicted from our theoretical model for non-cascade sputtering processes. A comparison of our previously predicted distribution for the case of sputtering without charge transfer to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80afbde4bdfa8c54cd4f5a4d892e97fa
https://doi.org/10.1016/0167-5087(83)91075-x
https://doi.org/10.1016/0167-5087(83)91075-x
Publikováno v:
Thin Solid Films. 53:55-62
X-ray diffraction, ion beam spectrochemical analysis, Auger electron spectroscopy and ion surface scattering techniques were used to characterize the chemically reacted film of gadolinium fluoride on the c surfaces of ferroelectric-ferroelastic gadol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::917bebb8328d4eccb0006323d1af5385
https://doi.org/10.1016/0040-6090(78)90372-3
https://doi.org/10.1016/0040-6090(78)90372-3