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pro vyhledávání: '"I. Wei"'
This paper introduces the Adaptive Learning Path Navigation (ALPN) system, a novel approach for enhancing E-learning platforms by providing highly adaptive learning paths for students. The ALPN system integrates the Attentive Knowledge Tracing (AKT)
Externí odkaz:
http://arxiv.org/abs/2305.04475
Autor:
I-Wei Fan1, Yu-Hsiang Chen1, Wan-Ling Hsu1, Chip-Jin Ng2, Yi-Ming Weng1,2 yiming33@adm.cgmh.org.tw
Publikováno v:
Signa Vitae. Sep2024, Vol. 20 Issue 9, p24-30. 7p.
Publikováno v:
Psychology Research & Behavior Management. May2024, Vol. 17, p2041-2053. 13p.
Autor:
Alvarez, Ana, Chen, I-Wei
This study of highly accelerated lifetime tests of SrTiO$_3$, a model semiconducting oxide, is motivated by the interest in reliable multilayer ceramic capacitors and resistance-switching thin-film devices. Our analytical solution to oxygen-vacancy m
Externí odkaz:
http://arxiv.org/abs/2012.15777
Autor:
Dong, Yanhao, Yang, Hongbing, Zhang, Lin, Li, Xingyu, Ding, Dong, Wang, Xiaohui, Li, Ju, Li, Jiangong, Chen, I-Wei
Publikováno v:
Adv. Funct. Mater. 2020, 2007750
Nanocrystalline metals and ceramics with <100 nm grain sizes and superior properties (e.g., mechanical strength, hardness, fracture toughness and stored dielectric energy) are of great interest. Much has been discussed about achieving nano grains, bu
Externí odkaz:
http://arxiv.org/abs/2002.12286
Akademický článek
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Akademický článek
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Autor:
Troxell, Bryan, Jaslow, Sarah L., Tsai, I-Wei, Sullivan, Chelsea, Draper, Benjamin E., Jarrold, Martin F., Lindsey, Kate, Blue, Levi
Publikováno v:
In Molecular Therapy - Methods & Clinical Development 14 September 2023 30:288-302
Oxygen ion migration in Li2MnO3 was systematically studied by first-principles calculations. Hole polaron is found effective to lower the migration barrier of oxygen ion.
Externí odkaz:
http://arxiv.org/abs/1908.05754
DC electrical degradation as a form of dielectric and resistance breakdown is a common phenomenon in thin-film devices including resistance-switching memory. To obtain design data and to probe the degradation mechanism, highly accelerated lifetime te
Externí odkaz:
http://arxiv.org/abs/1907.05479