Zobrazeno 1 - 4
of 4
pro vyhledávání: '"I. V. Shemerov"'
Autor:
I. V. Shemerov, Alexander Y. Polyakov, Stephen J. Pearton, In Hwan Lee, S. A. Tarelkin, Eugene B. Yakimov, Kang Bin Bae, N. B. Smirnov, Andrei V. Turutin
Publikováno v:
Journal of Alloys and Compounds. 686:1044-1052
Deep traps spectra measurements were performed for a group of n-GaN films grown by metalorganic chemical vapor deposition (MOCVD) on sapphire using standard MOCVD and two versions of lateral overgrowth techniques, the epitaxial lateral overgrowth (EL
Autor:
Stephen J. Pearton, N. B. Gladysheva, Alexander Y. Polyakov, Fan Ren, Andrei V. Turutin, A. A. Dorofeev, I. V. Shemerov, N. B. Smirnov, E. S. Kondratyev
Publikováno v:
ECS Journal of Solid State Science and Technology. 5:Q260-Q265
Autor:
N. B. Smirnov, Eugene B. Yakimov, I. V. Shemerov, Jong Hyeob Baek, In Hwan Lee, Alexander Y. Polyakov, Andrei V. Turutin, E. S. Kondratyev, Han Su Cho
Publikováno v:
ECS Journal of Solid State Science and Technology. 5:Q274-Q277
Autor:
N. B. Smirnov, Eugene B. Yakimov, S. A. Tarelkin, In Hwan Lee, I. V. Shemerov, Andrei V. Turutin, Stephen J. Pearton, Alexander Y. Polyakov
Publikováno v:
Journal of Applied Physics. 119:205109
A wide variety of parameters were measured for undoped n-GaN grown by hydride vapor phase epitaxy and compared to n-GaN films grown by conventional and lateral overgrowth metalorganic chemical vapor deposition. The parameters included deep level elec