Zobrazeno 1 - 3
of 3
pro vyhledávání: '"I. V. Bashelhanov"'
Autor:
N. N. Salaschenko, I. V. Bashelhanov, M. V. Kovalchuk, N. N. Novikova, S. I. Zheludeva, Yu. Ya. Platonov, A. D. Akhsakhalyan
Publikováno v:
Review of Scientific Instruments. 63:1519-1522
New possibilities of ultrathin film thickness and density determination are demonstrated by means of x‐ray method in the form of x‐ray standing wave technique (XSW) and total external fluorescence study (NTEF). Several samples with ultrathin Fe f
Autor:
Michael J. Bedzyk, I. V. Bashelhanov, M. V. Kovalchuk, N. N. Novikova, G. M. Bommarito, S. I. Zheludeva
Publikováno v:
Springer Proceedings in Physics ISBN: 9783642771460
An organic multilayer on LSM substrate having the same period was investigated by XSW formed in LSM measuring the fluorescence from heavy atoms of Langmuir-Blodgett(L-B) film. The inclination of organic chains was determined and the interface between
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9ea94512740283106ae83883e90a141
https://doi.org/10.1007/978-3-642-77144-6_24
https://doi.org/10.1007/978-3-642-77144-6_24
Publikováno v:
Springer Proceedings in Physics ISBN: 9783642771460
Distributional arrangement of heavy atoms inside a Langmuir-Blodgett (L-B) film was found by means of X-ray fluorescence technique under total external reflection. The thin L-B film (8 monolayers) of stearic acid deposited on silicon substrate was in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe2e6b3ca9273b98b02dea73c0e80df7
https://doi.org/10.1007/978-3-642-77144-6_23
https://doi.org/10.1007/978-3-642-77144-6_23