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Autor:
O. M. Zhigalina, K. A. Vorotilov, A. A. Mazitov, D. N. Khmelenin, N. M. Kotova, N. B. D’yakonova, I. S. Seregin
Publikováno v:
Physics of the Solid State. 54:997-998
The transmission electron microscopy, energy-dispersive, and X-ray powder diffraction analyses have been used to study the changes in the structure and phase composition of lanthanum-doped BiFeO3 and undoped BiFeO3 thin films synthesized by chemical