Zobrazeno 1 - 4
of 4
pro vyhledávání: '"I. M. Hatsevych"'
Autor:
T. N. Sabov, V. A. Nikirin, I. M. Hatsevych, O. I. Gudimenko, V. P. Melnyk, B. M. Romanyuk, V. M. Telega
Publikováno v:
Фізика і хімія твердого тіла, Vol 16, Iss 3, Pp 475-480 (2016)
The electrochromic WO3 and NiO films were deposited by magnetron sputtering on indium tin oxides coated glass. The structural properties of the films were investigated by scanning electron microscopy and X-ray diffractometery techniques. The electroc
Externí odkaz:
https://doaj.org/article/0b26d22a7aad43098ab358cb70065663
Autor:
O. M. Matkivskyy, I.V. Horichok, T.O. Semko, A. S. Oberemok, S. I. Mudryy, I. M. Hatsevych, I. M. Lischynskyy, G. D. Mateyik, R. O. Dzumedzey
Publikováno v:
Sensor Electronics and Microsystem Technologies. 14:53-64
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be57e3db5f9a7eaa0900b925f42063f0
https://doi.org/10.18524/1815-7459.2017.3.105564
https://doi.org/10.18524/1815-7459.2017.3.105564
Autor:
O. I. Gudimenko, V. M. Telega, V. P. Melnyk, T. N. Sabov, V. A. Nikirin, B. M. Romanyuk, I. M. Hatsevych
Publikováno v:
Фізика і хімія твердого тіла, Vol 16, Iss 3, Pp 475-480 (2016)
The electrochromic WO3 and NiO films were deposited by magnetron sputtering on indium tin oxides coated glass. The structural properties of the films were investigated by scanning electron microscopy and X-ray diffractometery techniques. The electroc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17aeeea453e43951ee082b1bf7a30282
http://journals.pu.if.ua/index.php/pcss/article/view/779
http://journals.pu.if.ua/index.php/pcss/article/view/779
Autor:
Bratus, O. L.1 bratus1981@gmail.com, Evtukh, A. A.1, Steblova, O. V.2 steblolia@gmail.com, Prokopchuk, V. M.2
Publikováno v:
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016, Vol. 19 Issue 1, p9-13. 5p.