SEE Testing on PADI-X for JUICE 8-Channel Ultrafast Charge Pre-Amplifier ASIC

Autor: Giani Egaña Fernández, E. Munoz, Christian Poivey, M. Kerenyi, H. Andersson, L. Bonora, M. Dominguez, I. Lopez-Calle, A. Sirin, Jj. Gonzalez

Publikováno v: 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

SEE testing carried out on PADI-X charge amplifier ASIC within ESA-JUICE mission context. Not SEL or permanent damage was detected. Full SEFI/CEM cross sections are provided with an ion LET range of 1-63 MeV.cm2/mg.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::04de8fba60847e4dc9835a9ddac7738a
https://doi.org/10.1109/radecs.2017.8696133

SRAMs SEL and SEU in-flight data from PROBA-II spacecraft

Autor: Ali Zadeh, Veronique Ferlet-Cavrois, P. Matthijs, N. Fleurinck, Michele Muschitiello, F.-X. Guerre, I. Lopez-Calle, S. Santandrea, Hugh Evans, K. Puimege, D. Gerrits, Reno Harboe-Sorensen, O. Montenbruck, Christian Poivey, M. D'Alessio, M. Markgraf, A. Grillenberger, F. Lochon, A. Keating

Publikováno v: 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground te

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::070766c3dec92d6e7125ea2c54ccd72b
https://doi.org/10.1109/radecs.2013.6937398

Laser induced single events in SRAMs

Autor: C. Palomar, Juan A. de Agapito, I. Lopez-Calle, J. G. Izquierdo, Francisco J. Franco

Publikováno v: E-Prints Complutense. Archivo Institucional de la UCM
instname
ResearcherID
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid

This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a7ff64b05de4e51d457ce0c0d34823b8
https://eprints.ucm.es/id/eprint/29179/1/eprintsucm29179.pdf

Laser tests on a power operational amplifier

Autor: Juan A. de Agapito, Francisco J. Franco, I. Lopez-Calle, J. G. Izquierdo, C. Palomar

Publikováno v: 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good candid

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::325e15081470d2bcd551fb9b40094d0d
https://doi.org/10.1109/radecs.2011.6131322

LASER system for space environment emulation

Autor: I. Lopez-Calle, Juan A. de Agapito, Francisco J. Franco, J. G. Izquierdo

Publikováno v: Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011.

The Sensors and Electronic Instrumentation Group of the University Complutense of Madrid has developed a system to emulate the cosmic radiations effects on electronic devices by LASER irradiations. Of great interest to the nuclear industry and space

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::511ed231b4de6dbfbfdf5b93583e55da
https://doi.org/10.1109/sced.2011.5744218