Zobrazeno 1 - 5
of 5
pro vyhledávání: '"I. F. Faria"'
Autor:
L. O. XAVIER, C. F. D. AVILA, V. FONSECA, A. G. D. DOMÍNGUEZ, A. P. ROCHA, A. OLIVEIRA JUNIOR, A. D. FERNANDES, A. C. F. S. LEAL, Arthur Trindade Maranhão COSTA, CAROLINE DE OLIVEIRA AALVESLVES, C. RUAS, D. V. OLIVEIRA, D. N. C. MARINHO, D. GALATO, DÉBORA J. DE FARIA, Delmo de Oliveira Torres ARGUELHES, Edson Luiz Zangrando FIGUEIRA, E. P. NASCIMENTO, Erica QUINAGLIA SILVA, F. X. C. SALGADO, F. P. MESQUITA, Flávio Marcelo BUSNELLO, G. G. LEDEZMA MENESES, G. M. R. BRAÑA, H. A. KIFORDU, I. B. S. BRANDÃO, I. F. FARIA, I. C. B. B. ZANETI, J. A. BELLONI, J. L. A. FRANCO, J. C. B. BORGES, Léa. M. Carrer. IAMASHITA, L. BACHER, L. GRANATO, L. H. SILVA JÚNIOR, M. A. GUEDES DE OLIVEIRA, M. I. MONTAGNER, M. A. MONTAGNER, N. V. BITTENCOURT, P. A. E. SAAVEDRA, P. T. M. COSTA, P. V. DEUS, PRISCILA ALMEIDA ANDRADE, R. GOMES, R. B. CHOUERI, S. GUIMARÃES, S. M. RODRIGUES PINTO, S. M. DIAS, T. H. FIOROTT, V. R. N. CRUVINEL, V.C ARRAES
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f8b4cadbc0f2afaaaa60b3deb66af20
https://doi.org/10.24824/978854443638.7
https://doi.org/10.24824/978854443638.7
Publikováno v:
Journal of Applied Physics. 59:3294-3296
The photothermal pyroelectric technique is applied to the characterization of photovoltaic cells and a comparison with the photoacoustic detection is presented. The difference between the photoacoustic and the pyroelectric data is interpreted in term
Publikováno v:
Journal of Physics E: Scientific Instruments. 20:891-893
A new method using He-Ne laser is proposed for the inspection and monitoring of micro-defects in enamelled wires. The method is based on the measurement of the light scattered from the wire. Its advantages over conventional optical and scanning elect
Publikováno v:
Applied Physics Letters. 47:1154-1156
A new pyroelectric technique for the thermal wave scanning microscopy is presented. The potentiality of the method for probing and characterizing defects in solid samples is tested for surface and subsurface defects.
Publikováno v:
Journal of Physics E: Scientific Instruments; Jul1987, Vol. 20 Issue 7, p1-1, 1p