Zobrazeno 1 - 6
of 6
pro vyhledávání: '"I. E. Clemente"'
Publikováno v:
Russian Microelectronics. 50:230-238
The possibilities of the spectral ellipsometry method for precise measurements in the development and study of technological processes of atomic-layer deposition in microelectronics are investigated. The applicability of the method to thin dielectric
Autor:
I. E. Clemente, D. A. Golosov, Z. E. Vakulov, E. G. Zamburg, A. V. Miakonkikh, A. P. Dostanko, Konstantin V. Rudenko, S M Zavadskiy, Oleg A. Ageev
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 81:1476-1480
The results are presented from studying the effect substrate temperature has on the morphological, electrophysical, and optical parameters of LiNbO3 films obtained via pulsed laser deposition. It is established that films formed at temperatures of 30
Autor:
V. S. Klimin, I. E. Clemente, Oleg A. Ageev, Z. E. Vakulov, A. V. Miakonkikh, Konstantin V. Rudenko, E. G. Zamburg
Publikováno v:
Journal of Physics: Conference Series. 1410:012050
This paper shows the results of thermodynamic analysis of interfacial interaction in the lithium-niobium-oxygen system. The temperature dependences of the change in the Gibbs free energy calculated, taking into account the non-linear temperature depe
Publikováno v:
Journal of Physics: Conference Series. 1124:081038
Autor:
D. A. Golosov, E. G. Zamburg, V. S. Klimin, Oleg A. Ageev, A. P. Dostanko, M.N. Ivonin, Konstantin V. Rudenko, D P Volik, Z. E. Vakulov, A. V. Miakonkikh, S M Zavadskiy, I. E. Clemente
Publikováno v:
Journal of Physics: Conference Series. 1124:022032
This paper shows the results of the study of size effects of electro-physical parameters in nanostructured LiNbO3 thin films fabricated by pulsed laser deposition. Obtained results shown that with an increase in the number of laser pulses from 50 000
Autor:
Z Vakulov, M Ivonin, E G Zamburg, V S Klimin, D P Volik, D A Golosov, S M Zavadskiy, A P Dostanko, A V Miakonkikh, I E Clemente, K V Rudenko, O A Ageev
Publikováno v:
Journal of Physics: Conference Series; 2019, Vol. 1124 Issue 2, p1-1, 1p