Zobrazeno 1 - 5
of 5
pro vyhledávání: '"I T, McGovern"'
Autor:
Hernandez, Y, V, Nicolosi, M, Lotya, F, Blighe, Z, Sun, S, De, I T, McGovern, B, Holland, M, Byrne, Y, Gunko, J, Boland, P, Niraj, G, Duesberg, S, Krishnamurti, R, Goodhue, J, Hutchison, V, Scardaci, A C, Ferrari, J N, Coleman
Fully exploiting the properties of graphene will require a method for the mass production of this remarkable material. Two main routes are possible: large-scale growth or large-scale exfoliation. Here, we demonstrate graphene dispersions with concent
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::deef0426055f2b15ef4a41485bc5a78e
https://www.repository.cam.ac.uk/handle/1810/286114
https://www.repository.cam.ac.uk/handle/1810/286114
Autor:
R. H. Williams, I. T. McGovern
Publikováno v:
Il Nuovo Cimento B Series 11. 38:241-247
Vacuum-cleaved single crystals of α-MoTe2 have been investigated by photoelectron spectroscopy. Angularly averaged results obtained over a range of photon energies by using a synchrotron source allow the form of thep- andd-components of the valence
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ab2bd7d2913d14869585de3a2a469a7
https://doi.org/10.1007/bf02723492
https://doi.org/10.1007/bf02723492
Autor:
John F. McGilp, I. T. McGovern
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 3:1641
A scheme for classifying the interfacial reactivity of metal–compound semiconductor systems is presented. The scheme uses a simple bulk model to calculate a ‘‘heat of reaction,’’ which includes the effects of metal–semiconductor anion com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::110f931115a45c2905be090c9352f19f
https://doi.org/10.1116/1.582954
https://doi.org/10.1116/1.582954
Autor:
I. T. Mcgovern, R. H. Williams
Publikováno v:
Japanese Journal of Applied Physics. 13:413
LEED, AES, photoemission, and surface photovoltage studies have been carried out an a range of materials which crystallise with layered structures. In all cases cleaved basal faces are extremely inert to common contaminants. Very slight bombardment w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7eebc62136f97ba170e2228272b1bc13
https://doi.org/10.7567/jjaps.2s2.413
https://doi.org/10.7567/jjaps.2s2.413