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Publikováno v:
Asian Journal of Endoscopic Surgery. 3:192-195
Introduction: During laparoscopic cholecystectomy, an enlarged field of vision increases safety and precision, but surgeons often encounter bleeding that can cause difficulties. It is important to prevent and control arterial bleeding from Calot's tr
Autor:
I. Katoh, Y. Hayashi, Kenji Matsuzaki, Hiromu Nishitani, Masanori Yoshizumi, O. Yoshida, Y. Amano, Masafumi Harada
Publikováno v:
Acta Radiologica. 35:405-408
Five patients with unilateral leg lymph edema had intraarterial injections of lymphocytes in the affected leg with consequent improvement in 3. To assess the degree of lymph edema, T2 and intensity ratio between the 2 legs in STIR images were used. M
Publikováno v:
Journal of Virology. 67:1830-1839
In vitro detection of a specific complex of the bovine leukemia virus (BLV) MA(p15) protein and the 5'-terminal RNA dimer led to the hypothesis that the NH2-terminal domain of retrovirus gag protein precursor is involved in the selective viral RNA pa
Publikováno v:
Scopus-Elsevier
We discovered a unique characteristic in a simple photonic crystal waveguide, which simultaneously gives the low group velocity and low dispersion. It will be used for a dispersion-free optical delay line and various functional devices.
Autor:
I. Katoh, M. Komaru, T. Ishida, Yoshihiro Notani, Y. Matsuda, N. Tanahashi, K. Kanaya, T. Ishikawa, T. Oku, T. Matsuzuka
Publikováno v:
IEEE MTT-S International Microwave Symposium Digest, 2003.
This paper presents a newly developed 76 GHz three-stage LNA for automotive radar systems. The LNA utilizes multi band rejection filter type stabilizing circuits to achieve good noise figure together with good stability. The operating bias condition
Publikováno v:
Semiconductor Science and Technology. 9:1733-1735
Commercially available, Czochralski-grown (CZ), phosphorus- and boron-doped (100) silicon wafers have been characterized by capacitance-voltage and deep-level transient spectroscopy measurements of Schottky diodes. Two electron traps labelled A1 (Ec-
Publikováno v:
2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203).
As semiconductor devices have been manufactured, a short circuit between metal interconnects is one of the major causes of lower product yields. There are many causes for interconnect short circuits. Increasingly complex semiconductor manufacturing p
Publikováno v:
2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203).
The two methods described are useful for stabilizing linewidths in photolithography without making any changes in existing processes and equipment. The methods can also be applied to the stabilization of line widths in 130-nm scale devices, which is