Zobrazeno 1 - 10
of 197
pro vyhledávání: '"I I Shvetsov"'
Publikováno v:
Bezopasnostʹ Informacionnyh Tehnologij, Vol 27, Iss 3, Pp 66-75 (2020)
This study offers an adapted method for monitoring functional failures in NOR flash memory during tests for resistance to heavy charged particles. The experiment was conducted on the basis of the "U-400" cyclotron. Experimental results of approbation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::71bfa7b4db8ca0ea035a58bc03593e10
https://doi.org/10.26583/bit.2020.3.06
https://doi.org/10.26583/bit.2020.3.06
Publikováno v:
Bezopasnostʹ Informacionnyh Tehnologij, Vol 27, Iss 3, Pp 43-53 (2020)
The paper presents the developed algorithm for correlating the physical and logical addressing in memory chips using laser radiation sources to determine the nature of failures in radiation tests. A variant of the hardware-software implementation of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3abb0f4d396fc1784b462f421e7cc55c
https://doi.org/10.26583/bit.2020.3.04
https://doi.org/10.26583/bit.2020.3.04
Publikováno v:
IEEE Transactions on Nuclear Science. 67:1540-1546
This article concerns experimental and simulation results on nonstable latchups (SLs) in CMOS integrated circuits (ICs) under pulsed laser irradiation. Different transient responses in elements of the p-n-p-n structure and irregular ionization distri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c96178436ce6cb31341065956494f5d1
https://doi.org/10.1109/tns.2020.3001169
https://doi.org/10.1109/tns.2020.3001169
Publikováno v:
2021 IEEE 32nd International Conference on Microelectronics (MIEL).
The paper concerns experimental results on external conditions such as temperature, voltage supply, current limit, and features of the power circuit on latchup occurrence under uniform laser irradiation.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a17d718edfbdc3e82874918df9f5cd0f
https://doi.org/10.1109/miel52794.2021.9569126
https://doi.org/10.1109/miel52794.2021.9569126
Autor:
Alexander I. Chumakov, I. I. Shvetsov-Shilovskiy, Alexander A. Pechenkin, Alexander A. Novikov, E. N. Oblova
Publikováno v:
2021 IEEE 32nd International Conference on Microelectronics (MIEL).
In an Integrated Circuit with high SEL holding voltage, pulsed-laser radiation sensitivity was found to change due to TID irradiation. The impact of TID on the DUT SEL holding voltage and SEL sensitivity was investigated.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::376284c377f97912b5edb4c72afe53ed
https://doi.org/10.1109/miel52794.2021.9569140
https://doi.org/10.1109/miel52794.2021.9569140
Autor:
A. V. Kobylyatskii, Anna B. Boruzdina, I. I. Shvetsov-Shilovskii, A. V. Ulanova, N. G. Grigor’ev, Yu. M. Gerasimov
Publikováno v:
Russian Microelectronics. 48:268-272
This article deals with a study of radiation-induced leakages between n-regions of various types using test structures fabricated according to the 0.18-µm CMOS technology. It is shown that, depending on the radiation exposure dose, the leakages betw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::120dca838cdb0f9cc9b81a8f460c6833
https://doi.org/10.1134/s1063739719030028
https://doi.org/10.1134/s1063739719030028
Autor:
V. D. Kalashnikov, Sergey B. Shmakov, Andrey G. Petrov, V. A. Chepov, I. I. Shvetsov-Shiovsky
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
The paper describes an automated system for monitoring the parameters of solid-state drives under the influence of ionizing radiation using National Instruments equipment and NI LabVIEW software. The paper presents a block diagram of a test bench dev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::073a48b37c18bb662a8a3d8be393639c
https://doi.org/10.1109/sibcon50419.2021.9438860
https://doi.org/10.1109/sibcon50419.2021.9438860
Autor:
Andrey G. Petrov, Sergey B. Shmakov, Andrey V. Yanenko, A. A. Gracheva, I. I. Shvetsov-Shilovskiy
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
The paper presents an automated control system for leakage currents monitoring in memory ICs based on National Instruments PXI platform. One of the two standard low-level boards used in our laboratory has been modified with an intermediate board to m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73666867db3994f851646a593b007df4
https://doi.org/10.1109/sibcon50419.2021.9438909
https://doi.org/10.1109/sibcon50419.2021.9438909
Publikováno v:
IOP Conference Series: Earth and Environmental Science. 996:012013
The efficiency of milking dairy farm animals depends on the reliability of the milking equipment. Domestic milking machines are equipped with UVU 45/60 with a rotary vacuum pump that has an extremely limited service life, which is mainly due to imper
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5df083bf5168c0121ef3e1d08f54600d
https://doi.org/10.1088/1755-1315/996/1/012013
https://doi.org/10.1088/1755-1315/996/1/012013
Publikováno v:
KnE Life Sciences.
The study of the forces acting on the animal in the installation for fixing with veterinary treatments. The most time consuming processes in service animals are zootechnical and veterinary treatment of sheep. During the year, it is necessary to carry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69a409692ab76cf5d475907a5c42165f
https://doi.org/10.18502/kls.v4i14.5677
https://doi.org/10.18502/kls.v4i14.5677