Zobrazeno 1 - 10
of 44
pro vyhledávání: '"I A, Artioukov"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 517:372-377
The use of depleted uranium (DU) and DU-based compounds is shown to significantly increase the performance of multilayer mirrors intended for the wavelengths 3–6 nm. In comparison with multilayers based on 3d-elements the increase of peak reflectiv
Publikováno v:
Journal of Optics A: Pure and Applied Optics. 4:233-236
The wavefront transformation of a beam reflected from a multilayer coating is considered. The field distribution in the reflected beam is expressed in terms of the field distribution of the incident beam and the characteristics of the reflective coat
Autor:
I. A. Artioukov, Aleksandr V Vinogradov, M. Yamamoto, J.J. Roca, R.M. Fechtchenko, M. Seminario, Brady Benware
Publikováno v:
Scopus-Elsevier
The capillary discharge ArIX laser (wavelength 46.9nm) is a new device attractive for various applications due to its unique for XUV lasers properties: high average power and compactness. Reflectometry and ellipsometry are among them. The first is ca
Autor:
Jorge Filevich, Héctor Mancini, K. Kanizay, Aleksandr V Vinogradov, I. A. Artioukov, V.N. Shlyaptsev, M. Seminario, Mario C. Marconi, A. Ozols, Fernando Gustavo Tomasel, Brady Benware, Jorge J. Rocca, M. Frati, Yu. A. Uspenskii
Publikováno v:
Le Journal de Physique IV. 11:Pr2-459
For many years researchers have envisioned the development of compact high repetition rate tabletop soft x-ray lasers that could be routinely used in application in numerous disciplines. With demonstrated average powers of several mW and millijoule-l
Autor:
Aleksandr V Vinogradov, M. Forsythe, I. A. Artioukov, Jorge J. Rocca, Yu. A. Uspenskii, Brady Benware
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 5:1495-1501
We report the measurement of the optical constants of Si, GaP, InP, GaAs, GaAsP, and Ir at a wavelength of 46.9 nm (26.5 eV). The optical constants were obtained from the measurement of the variation of the reflectivity as a function of angle utilizi
Autor:
D. A. Vikhlyaev, V. I. Ostashev, An. V. Vinogradov, A.V. Lipin, O. N. Gilev, A.V. Potapov, I. L. Svyatov, I. A. Artioukov, V.A. Pronin, O.V. Chefonov
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 575:248-250
In this paper, we present experimentally determined reflection factors of mirrors based on the depleted uranium and dependence of reflection factor on time of presence of samples on air.
Publikováno v:
Journal of X-Ray Science and Technology. 6:223-243
The influence of smooth (not step-like) variation of the dielectric function near a surface on the reflectivity and scattering of x rays is investigated theoretically with the model function ϵ(z) = 1 − 0.5(1 − ϵ+)(1 + tanh(z/(2L))) taken as an
Publikováno v:
Review of Scientific Instruments, 74(11), 4964-4966. AMER INST PHYSICS
This Note deals with thin-film soft x-ray filters for operation at the wavelengths near carbon K edge (similar to4.5 nm). The filters were fabricated by magnetron sputtering deposition of thin layers of scandium (total thickness 0.1-0.2 mum) onto fil
Publikováno v:
Journal of X-ray science and technology. 8(3)
The paper deals with the application of soft X-ray optics to the enhancement of the efficiency of X-ray proximity lithography based on a point X-ray source. The grazing incidence X-ray collimators are shown to increase the efficiency coefficient in s
Autor:
Dale Martz, Jorge J. Rocca, David Alessi, Anne Sakdinawat, Fernando Brizuela, Y. W. Liu, B. LaFontaine, Aleksandr V Vinogradov, Mario C. Marconi, Carmen S. Menoni, B. M. Luther, Yong Wang, David Attwood, Kenneth A. Goldberg, Sergio Carbajo, I. A. Artioukov, Erik H. Anderson, W. Chao
Publikováno v:
Springer Proceedings in Physics ISBN: 9789400711853
We describe the implementation of a zone plate microscope for atwavelength characterization of extreme ultraviolet masks. The microscope uses as illumination the 13.2 nm wavelength output from a table-top Ni-like Cd laser. The microscopy allows inspe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf99ab156e61f449ad24c67737e4c20c
https://doi.org/10.1007/978-94-007-1186-0_41
https://doi.org/10.1007/978-94-007-1186-0_41