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Publikováno v:
Journal of microscopy. 251(2)
Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene
Autor:
J. Fišer, I. Müllerová
Publikováno v:
Review of Scientific Instruments. 65:1968-1972
A stray magnetic field troubles all designers of electron microscopes. The influence of this field is most critical when an ultrahigh‐vacuum low‐voltage scanning microscope is to be designed. Transversal components of the stray magnetic field def
Autor:
M. Lenc, I. Müllerová
Publikováno v:
Ultramicroscopy. 45:159-162
The analytical expression of the axial aberration coefficients of the cathode lens in combination with a focusing lens was derived and the values compared with those when only a cathode lens is used. For the real arrangement of the cathode lens in co
Autor:
I. Müllerová, M. Lenc
Publikováno v:
Ultramicroscopy. 41:399-410
The advantages of the low-energy electrons for surface study and different approaches to the design of low-voltage scanning electron microscope are briefly summarized. The retarding electrostatic field optics in front of a final cross-over image was
Autor:
M. Lenc, I. Müllerová
Publikováno v:
Ultramicroscopy. 41:411-417
The basic optical parameters of the cathode lens are summarised in this paper, and exact analytical expressions for the axial aberration coefficients are derived. The values of aberration coefficients of the cathode lens are compared with those of th
Autor:
I, Müllerová, I, Konvalina
Publikováno v:
Journal of microscopy. 236(3)
Collection of the secondary electrons in the scanning electron microscope was simulated and the results have been experimentally verified for two types of the objective lens and three detection systems. The aberration coefficients of both objective l
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b61e840257dcf9eacbd240ae5b72742
https://doi.org/10.1007/978-3-540-85156-1_285
https://doi.org/10.1007/978-3-540-85156-1_285
Autor:
L. Frank, I. Müllerová
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
For acquisition of secondary (SE) as well as backscattered electrons (BSE) in the scanning electron microscope (SEM), single-channel detection systems are traditionally used. We have designed a multi-channel detector collecting BSE emitted to eight i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::479e246823709eeb9b31e1cb9806ddd8
https://doi.org/10.1007/978-3-540-85156-1_293
https://doi.org/10.1007/978-3-540-85156-1_293
Publikováno v:
Scanning. 12:70-74