Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Hyunseo You"'
Autor:
Hyunseo You, Kihoon Nam, Jehyun An, Chanyang Park, Donghyun Kim, Seonhaeng Lee, Namhyun Lee, Rock-Hyun Baek
Publikováno v:
IEEE Access, Vol 12, Pp 10988-10994 (2024)
This study investigated a novel forward body bias (FBB) analysis to optimize the threshold voltage ( $\text{V}_{\mathrm {th}}$ ) at cryogenic temperatures in the latest dynamic random-access memory (DRAM). Electrical measurements were conducted to an
Externí odkaz:
https://doaj.org/article/0d98260d7f88492fb8965b2bee05a9ea
Autor:
Jehyun An, Kyeongkeun Choi, Jongseo Park, Bohyeon Kang, Hyunseo You, Sungmin Ahn, Rockhyun Baek
Publikováno v:
Nanomaterials, Vol 13, Iss 4, p 731 (2023)
In this study, the electrical properties of Al2O3 film were analyzed and optimized to improve the properties of the passivation layer of CMOS image sensors (CISs). During Al2O3 deposition processing, the O2 plasma exposure time was adjusted, and H2 p
Externí odkaz:
https://doaj.org/article/c12a845cacd04989849dfd0fd8433f38
Autor:
Bohyeon Kang, Jongseo Park, Junghyeon Hwang, Sangho Lee, Hunbeom Shin, Jehyun An, Hyunseo You, Sung-Min Ahn, Sanghun Jeon, Rock-Hyun Baek
Publikováno v:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86234e3b9b42e3cbbb3db318351bc17d
https://doi.org/10.1109/edtm55494.2023.10102929
https://doi.org/10.1109/edtm55494.2023.10102929
Autor:
Hyunseo You, Jehyun An, Kihoon Nam, Bohyeon Kang, Jongseo Park, Namhyun Lee, Seonhaeng Lee, Rock-Hyun Baek
Publikováno v:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f3000f7ca23a61b42b6c85f23f40adb
https://doi.org/10.1109/edtm55494.2023.10102979
https://doi.org/10.1109/edtm55494.2023.10102979