Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Hyungjun Han"'
Autor:
Jong-Eun Park, Mickey Bahar, Kyung-Ho Lee, Shay Hamami, Youngheup Jang, Sangjoo Lee, Hiroshige Goto, Bum-Suk Kim, Yun-Tae Lee, Chang-Rok Moon, Duck-Hyung Lee, Jung-Chak Ahn, Taesub Jung, Young-Hwan Park, Yi-tae Kim, Uzi Hizi, Hyungjun Han
Publikováno v:
ISSCC
As pixel sizes continue to scale down, backside-illuminated (BSI) technology has been recently adopted as a solution to improve pixel SNR performance [1,2]. In addition, as the application of image sensors widens from digital still cameras to digital
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9ecfe039974eafe3ec2360a543e02f1
https://doi.org/10.1109/isscc.2011.5746377
https://doi.org/10.1109/isscc.2011.5746377
Autor:
Sung-Hyung Park, J. McKee, Ju-Il Lee, M. Louie, Thomas Joy, C. Palsule, Dae-Byung Kim, Bedabrata Pain, P. Altice, Hyungjun Han, J. Hynecek, C. Boemler, Chen Feng, Chae-Seon Hong, Changhoon Choi, Sangjoo Lee, Sung Gyu Pyo, H. Haddad
Publikováno v:
2007 IEEE International Electron Devices Meeting.
A back-illuminated 2 megapixel CMOS sensor utilizing mature wafer manufacturing operations is described. Sensitivity, dark current and other key pixel performance measures are compared against an equivalent conventional sensor. Aspects of the process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b29db74214edd018ddedea9524ee9f52
https://doi.org/10.1109/iedm.2007.4419125
https://doi.org/10.1109/iedm.2007.4419125
Autor:
Joy, T., Sunggyu Pyo, Sunghyung Park, Changhoon Choi, Palsule, C., Hyungjun Han, Chen Feng, Sangjoo Lee, McKee, J., Altice, P., Hong, C., Boemler, C., Hynecek, J., Louie, M., Juil Lee, Daebyung Kim, Haddad, H., Pain, B.
Publikováno v:
2007 IEEE International Electron Devices Meeting; 2007, p1007-1010, 4p
Autor:
Sangjoo Lee, Kyungho Lee, Jongeun Park, Hyungjun Han, Younghwan Park, Taesub Jung, Youngheup Jang, Bumsuk Kim, Yitae Kim, Hamami, S., Hizi, U., Bahar, M., Changrok Moon, JungChak Ahn, Duckhyung Lee, Goto, H., Yun-Tae Lee
Publikováno v:
2011 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC); 2011, p416-418, 3p