Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Hyungil Woo"'
Publikováno v:
IEEE Access, Vol 9, Pp 102161-102176 (2021)
Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides high fault coverage. However, scan-based DFT is prone to security vulnerabilities where attackers use the scan design to obtain secret information from the
Externí odkaz:
https://doaj.org/article/a3e31dbea9054699ac2ed36c1170d790
Publikováno v:
IEEE Access, Vol 9, Pp 102161-102176 (2021)
Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides high fault coverage. However, scan-based DFT is prone to security vulnerabilities where attackers use the scan design to obtain secret information from the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98bb6a27397470cf71e9b46d9c048092
https://ieeexplore.ieee.org/document/9486853/
https://ieeexplore.ieee.org/document/9486853/
Publikováno v:
2021 18th International SoC Design Conference (ISOCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70534efa00b4bcb78b5ebd0c3b479c26
https://doi.org/10.1109/isocc53507.2021.9614012
https://doi.org/10.1109/isocc53507.2021.9614012