Zobrazeno 1 - 10 of 13 pro vyhledávání: '"Hyun-Min Ahn"'
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Akademický článek
Incidence and short-term outcomes of central line-related bloodstream infection in patients admitted to the emergency department: a single-center retrospective study
Autor: Hyun Min Ahn, June-sung Kim, Min Gul Park, Jeongeun Hwang, Won Young Kim, Dong-Woo Seo
Publikováno v: Scientific Reports, Vol 13, Iss 1, Pp 1-6 (2023)
Abstract Central line-related bloodstream infection (CRBSI) is a common complication during hospital admissions; however, there is insufficient data regarding CRBSI in the emergency department. Therefore, we evaluated the incidence and clinical impac
Externí odkaz: https://doaj.org/article/93ca50a73b544bf1a5b380c13065e06e
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4
Short-term outcomes of catheter-related bloodstream infection in patients admitted to the emergency department: a single-center retrospective study
Autor: Hyun Min Ahn, June-sung Kim, Min Gul Park, Jeongeun Hwang, Won Young Kim, Dong Woo Seo
Central line-related bloodstream infection (CRBSI) is a common complication during hospital admissions; however, there is insufficient data regarding CRBSI in the emergency department. Therefore, we evaluated the incidence and clinical impact of CRBS
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3b5e4ea7225a4f69c0dc77cc71cda239
https://doi.org/10.21203/rs.3.rs-1988367/v1
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6
Improvement in current drivability and stability in nanoscale vertical channel thin-film transistors via band-gap engineering in In–Ga–Zn–O bilayer channel configuration
Autor: Hyun-Min Ahn, Young-Ha Kwon, Nak-Jin Seong, Kyu-Jeong Choi, Chi-Sun Hwang, Jong-Heon Yang, Yong-Hae Kim, Gyungtae Kim, Sung-Min Yoon
Publikováno v: Nanotechnology. 34:155301
Vertical channel thin film transistors (VTFTs) have been expected to be exploited as one of the promising three-dimensional devices demanding a higher integration density owing to their structural advantages such as small device footprints. However,
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::20fc9cd9aa1a1e61380acd76274cd787
https://doi.org/10.1088/1361-6528/acb3cc
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